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1. X線・中性子小角散乱法及び3次元アトムプローブ法による Cu-Ni-Si合金中のδNi2Si析出相の解析

Description/Abstract:: The strength of Cu-Ni-Si alloy can be improved by finely dispersing a Ni-Si-based compound as a precipitate into the Cu parent phase by h...
Keyword:: Corson alloy, atom probe tomography, and transmission electron microscopy
Resource Type:: Article
Author:: 佐々木宏和, 秋谷俊太, 三原邦照, 大場洋次郎, 大沼正人, 埋橋淳, and 大久保忠勝
Journal:: Journal of Japan Institute of Copper
Date Uploaded:: 30/01/2024