Search Constraints
Search Results
Select an image to start the slideshow
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
1 of 14
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
2 of 14
Electron Inelastic Mean Free Paths in Liquid Water for Energies from10 eV to 10 keV
3 of 14
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
4 of 14
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
5 of 14
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
6 of 14
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
7 of 14
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
8 of 14
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
9 of 14
材料データプラットフォームDICE2.0 - データ創出−蓄積−利用−連携の基盤
10 of 14
IoT データ収集システムのデータアーキテクチャ
11 of 14
材料データプラットフォームシステムDICEにおける研究データフローの構築―実践と課題
12 of 14
First-principles calculations of optical constants
13 of 14
Automatic Experimental Data Collection System Using a Wireless LAN Capable SD Card as an IoT Device
14 of 14