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べき乗則で解釈されるスペクトルの閾値及びべき乗数の自動解析方法
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Estimation of Inelastic Mean Free Paths in Au and Cu from Their Elastic Peak Intensity Ratios without IMFP Values of Reference Material in The 200 – 5000 eV Energy Range
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High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Holder based on Geometric Characteristics of Auger Electron Spectroscopy Apparatus Equipped with Concentric Hemispherical Analyzer
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Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incidence Ion Beam
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InP/GaInAs多層膜のAES深さ方向分析のラウンドロビン試験報告(I)
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InP/GaInAsP多層膜におけるAES深さ分解能の温度依存性
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電子線マイクロアナライザーによるMg-Ge合金の定量 -Mg Kαに対するGeの質量吸収係数の検討- and Electron microprobe analysis of Mg-Ge alloy -Examination of the mass absorption coefficient of Ge for MgKα–
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Arイオンスパッタリングされた各種化合物半導体表面のSEM観察
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Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
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表面電子分光法における信号の減衰はいかに記述されるか? II. 誘電関数とIMFP
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