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XPS spectral data for p- and n-type Si wafers with various resistivities acquired at SPring-8 BL15
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表面電子分光法における信号の減衰は如何に記述されるか? V. 誘電関数を用いた固体における電子の非弾性散乱断面積
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電子の非弾性平均自由行程の一般式:JTP 式の開発
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10eV - 30 keVにおける固体中の電子阻止能の計算
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モノづくりを支える表面分析技術: 表面分析の現状とその課題
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Calculations of Electron Inelastic Mean Free Paths in Solids over the 10 eV to 200 keV Energy Range with the Relativistic Full Penn Algorithm
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Calculations and Measurements of Electron Inelastic Mean Free Paths in Solids
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TWA2 表面分析化学 2005年度のプロジェクトの概要と進捗
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Electron Inelastic Mean Free Paths in Liquid Water for Energies from10 eV to 10 keV
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Analysis of electron inelastic scattering in solids over wide energy range and its application to surface chemical analysis
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