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Filtering by: Characterization methods spectroscopy -- x-ray photoelectron spectroscopy Remove constraint Characterization methods: spectroscopy -- x-ray photoelectron spectroscopy Material/Specimen In Sputtered Remove constraint Material/Specimen: In Sputtered

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HAXPES spectra of In Sputtered

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Type of work

Dataset1

Collection

MDR HAXPES DB1

Keyword

BL46XU1
HAXPES1
In Sputtered1
SPring-81
collection - MDR HAXPES DB1

Resource type

Dataset1

Visibility

open1

Rights Statement Sim

Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International1

Data origin

experiments1

Characterization methods

spectroscopy -- x-ray photoelectron spectroscopy[remove]1

Material/Specimen

In Sputtered[remove]1

Contact person

Industrial Application and Partnership Division, JASRI1

Instrument manufacturer

Japan Synchrotron Radiation Research Institute1

Instrument managing organization

Japan Synchrotron Radiation Research Institute1

National Institute for Materials Science

Research Network and Facility Services Division (RNFS)
Materials Data Platform

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