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Yoshikawa, Hideki
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Development of multiple core-level XPS spectra decomposition method based on the Bayes...
Automated information compression of XPS spectrum using information criteria
English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysi...
Calculations of Electron Inelastic Mean Free Paths. XI. Data for Liquid Water for Ener...
Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Li...
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Keyword
Active Shirley method
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Akaike information criterion (AIC)
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Auger Depth Profiling Analysis
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Automatic spectrum analysis
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Bayesian information criterion
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English
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Elsevier
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Surface Analysis Society of Japan
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Wiley
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Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
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2019
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2020
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2019
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Author
Yoshikawa, Hideki
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Shinotsuka, Hiroshi
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Murakami, Ryo
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Tanaka, Hiromi
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Tanuma, Shigeo
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https://creativecommons.org/licenses/by-nc-nd/4.0/
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Journal
Journal of Electron Spectroscopy and Related Phenomena
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Journal of Electron Spectroscopy and Related Phenomena
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Journal of Surface Analysis
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Surface and Interface Analysis
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