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Characterization methods
spectroscopy -- x-ray absorption spectroscopy
Remove constraint Characterization methods: spectroscopy -- x-ray absorption spectroscopy
Instrument manufacturer
Japan Synchrotron Radiation Research Institute
Remove constraint Instrument manufacturer: Japan Synchrotron Radiation Research Institute
Keyword
Tantalum nitride
Remove constraint Keyword: Tantalum nitride
Keyword
XAFS
Remove constraint Keyword: XAFS
Resource type
Dataset
Remove constraint Resource type: Dataset
Material/Specimen
Tantalum nitride
Remove constraint Material/Specimen: Tantalum nitride