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Journal of Surface Analysis
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電子線マイクロアナライザーによるMg-Ge合金の定量 -Mg Kαに対するGeの質量吸収係数の検討- and Electron microprobe analysis of Mg-Ge alloy -Examination of the mass absorption coefficient of Ge for MgKα–
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Auger Depth Profiling Analysis
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Ultra Low Angle Incidence Ion Beam
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HfO2/Si
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Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
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Ogiwara, Toshiya
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Tanuma, Shigeo
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H. Yoshikawa
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Journal of Surface Analysis
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