Index Catalog // MDR

Start Over

Filtering by: Author Koji Kimoto Journal Small Methods Rights Statement Sim Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International

Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron Microscopy

Description/Abstract:

Aberration-corrected scanning transmission electron microscopy (STEM) has been advancing resolution, sensitivity, and microanalysis due t...

Keyword:

Automation, FIB, and TEM

Resource Type:

Article

Author:

Hideyo Tsurusawa, Jun Uzuhashi, Yusuke Kozuka, Koji Kimoto, and Tadakatsu Ohkubo

Journal:

Small Methods

Date Uploaded:

02/05/2024

Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron Microscopy

Limit your search

Type of work

Keyword

Language

Publisher

Resource type

Visibility

Rights Statement Sim

Author

Funder

Journal

Search Constraints

Search Results

Limit your search