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Jun Uzuhashi
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Automation
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Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron Microscopy
Description/Abstract:
Aberration-corrected scanning transmission electron microscopy (STEM) has been advancing resolution, sensitivity, and microanalysis due t...
Keyword:
Automation
,
FIB
, and
TEM
Resource Type:
Article
Author:
Hideyo Tsurusawa
,
Jun Uzuhashi
,
Yusuke Kozuka
,
Koji Kimoto
, and
Tadakatsu Ohkubo
Journal:
Small Methods
Date Uploaded:
02/05/2024
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Automation
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TEM
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Wiley
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Rights Statement Sim
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
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Hideyo Tsurusawa
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Jun Uzuhashi
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Koji Kimoto
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Tadakatsu Ohkubo
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Yusuke Kozuka
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Ministry of Education, Culture, Sports, Science and Technology
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Small Methods
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