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Characterization methods
spectroscopy -- x-ray absorption spectroscopy
Remove constraint Characterization methods: spectroscopy -- x-ray absorption spectroscopy
Instrument manufacturer
Japan Synchrotron Radiation Research Institute
Remove constraint Instrument manufacturer: Japan Synchrotron Radiation Research Institute
Collection
MDR XAFS DB
Remove constraint Collection: MDR XAFS DB
Material/Specimen
Tantalum nitride
Remove constraint Material/Specimen: Tantalum nitride