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Yoshikawa, Hideki
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Japanese
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HfO2
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Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
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Auger Depth Profiling analysis
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HfO2/Si
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Ultra Low Angle Incidence Ion Beam
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Language
Japanese
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Surface Analysis Society of Japan
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Material/Specimen
HfO2
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Nagata, Takahiro
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Ogiwara, Toshiya
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Yoshikawa, Hideki
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Journal of Surface Analysis
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