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Gate-modulated reflectance spectroscopy for detecting excitonic states in two-dimensional semiconductors

Description/Abstract:

We have developed a microspectroscopy technique for measuring gate-modulated reflectance to probe excitonic states in two-dimensional tra...

Keyword:

2D materials, excitons, and modulation spectroscopy

Resource Type:

Article

Author:

Mengsong Xue, Kenji Watanabe, Takashi Taniguchi, and Ryo Kitaura

Journal:

APPLIED PHYSICS LETTERS

Date Uploaded:

12/01/2024

Date Modified:

15/01/2024