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Filtering by: Instrument manufacturer Ritsumeikan SR Center Keyword Oxide Keyword Si K-edge

XAFS spectrum of Quartz

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Quartz measured at Ritsumeikan-SR BL-13, and is a...

Keyword:

BL-13, Oxide, Quartz, Ritsumeikan-SR, Si K-edge, SiO2(quartz), XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022
XAFS spectrum of Silicon dioxide (amorphous)

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon dioxide (amorphous) measured at Ritsumeik...

Keyword:

BL-10, Oxide, Ritsumeikan-SR, Si K-edge, SiO2(amorphous), Silicon dioxide (amorphous), XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022
XAFS spectrum of Silicon dioxide (Quartz)

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon dioxide (Quartz) measured at Ritsumeikan-...

Keyword:

BL-10, Oxide, Ritsumeikan-SR, Si K-edge, SiO2(quartz), Silicon dioxide (Quartz), XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022