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Calculations of Electron Inelastic Mean Free Paths IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP-2 for electron energies between 50 and 2000 eV
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Calculations of Electron Inelastic Mean Free Paths III. Data for 15 Inorganic compounds over the 50 - 2000 eV Range
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Calculations of Electron Inelastic Mean Free Paths II. Data for 27 Elements over the 50 - 2000 eV Range
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Calculations of Electron Inelastic Mean Free Paths for 31 Materials
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Calculations of Electron Inelastic Mean Free Paths (IMFPs). XIV. Calculated IMFPs for LiF and Si3N4 and Development of an Improved Predictive IMFP Formula
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Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV range
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Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids over the 50 eV to 200 keV range with the relativistic full Penn algorithm
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Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
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Calculations of Electron Inelastic Mean Free Paths. XI. Data for Liquid Water for Energies from 50 eV to 30 keV
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Calculations of electron inelastic mean free paths. XII. Data for 42 inorganic compounds over the 50 eV to 200 keV range with the full Penn algorithm
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