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Keyword
- AES1
- Auger electron spectroscopy1
- IMFP1
- ISO1
- International Organization for Standardization1
- Li, Be, diamond, graphite, Na, K, Sc, Ge, In, Sn, Cs, Gd, Tb, Dy, Al1
- TPP-2M equation1
- X-ray photoelectron spectroscopy1
- XPS1
- electron inelastic mean free path1
- quantitative surface analysis1
- rare-earth elements1
- relative sensitivity factor1