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Hideki Yoshikawa
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Kazuhito Tsukagoshi
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Zejun Ding
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four-point probe technique
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Measurement of the Low-Energy Electron Inelastic Mean Free Path in Monolayer Graphene
Description/Abstract:
Measuring the electron-transport properties of substrate-supported nanomaterials with the traditional two-point comparison method is diff...
Keyword:
four-point probe technique
,
inelastic mean free path
, and
monolayer graphene
Resource Type:
Article
Author:
Bo Da
,
Yang Sun
,
Zhufeng Hou
,
Jiangwei Liu
,
Nguyen Thanh Cuong
,
Kazuhito Tsukagoshi
,
Hideki Yoshikawa
,
Shigeo Tanuma
,
Jin Hu
,
Zhaoshun Gao
, and
Zejun Ding
Date Uploaded:
04/04/2023
Date Modified:
05/04/2023
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four-point probe technique
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inelastic mean free path
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monolayer graphene
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American Physical Society (APS)
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Hideki Yoshikawa
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