Dataset: Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron Microscopy

Filename: Small Methods - 2024 - Tsurusawa - Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron-1.pdf (Thumbnail) Download

Content type: application/pdf

Size: 6.78 MB

Checksum: 7971d57b75e046a89d5fbcd93fe91ffb

Back