Dataset: Investigation of Deep States in GaN Metal-Oxide-Semiconductor Interfaces
Filename: Irokawa_2026_ECS_J._Solid_State_Sci._Technol._15_055002.pdf (サムネイル) Download
Content type: application/pdf
Size: 2.04MB
Checksum: 9da37650785d773fc75f518bc14dc2f3
戻る