Relationship between network topology and negative electrode properties in Wadsley–Roth phase TiNb2O7
- ジャーナル論文
- 著者
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;Naoto Kitamura (author) (この著者で検索);Hikari Matsubara (author) (この著者で検索);Koji Kimura (author) (この著者で検索);Ippei Obayashi (author) (この著者で検索)Yohei Onodera (author) (この著者で検索)National Institute for Materials Science
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;Ken Nakashima (author) (この著者で検索);Hidetoshi Morita (author) (この著者で検索)Motoki Shiga (author) (この著者で検索)National Institute for Materials Science
;
;Yasuhiro Harada (author) (この著者で検索);Chiaki Ishibashi (author) (この著者で検索);Yasushi Idemoto (author) (この著者で検索)Koichi Hayashi (author) (この著者で検索) - キーワード
- lithium-ion batteries, persistent homology
- 刊行年月日
- 2024-12-10
- 更新時刻
- 2024-12-18 16:30:39 +0900
Thermal Conductivity and Thermal Boundary Resistance of Low–Dielectric Constant Interlayer Dielectrics in Advanced Very Large Scale Integration Interconnects
- ジャーナル論文
- 著者
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;Tianzhuo Zhan (author) (この著者で検索);Chong Zheng (author) (この著者で検索);Mao Xu (author) (この著者で検索);Zhi Cao (author) (この著者で検索)Yen-Ju Wu (author) (この著者で検索)National Institute for Materials Science
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Yibin Xu (author) (この著者で検索)National Institute for Materials Science
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;Ryo Yokogawa (author) (この著者で検索);Atsushi Ogura (author) (この著者で検索)Yanming Xue (author) (この著者で検索)
https://orcid.org/0000-0003-1061-229X
(unauthenticated)
National Institute for Materials Science
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;Haidong Wang (author) (この著者で検索);Mengjie Song (author) (この著者で検索);Wei Wang (author) (この著者で検索);Bo Chen (author) (この著者で検索);Takanobu Watanabe (author) (この著者で検索);Yonggang Jiang (author) (この著者で検索);Huawei Chen (author) (この著者で検索)Deyuan Zhang (author) (この著者で検索) - キーワード
- thermal conductivity, thermal boundary resistance, low-k dielectrics, VLSI interconnects, persistent homology
- 刊行年月日
- 2025-09-23
- 更新時刻
- 2026-04-30 12:01:11 +0900