キーワード: focused ion beam
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Systematic study of FIB-induced damage for the high-quality TEM sample preparation.pdf
Systematic study of FIB-induced damage for the high-quality TEM sample preparation
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI
キーワード
focused ion beam, transmission electron microscopy
刊行年月日
2024-04-26
更新時刻
2024-05-07 15:32:35 +0900
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled STEM lamella preparation via FIB-SEM.pdf
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM
ジャーナル論文
著者
ORCID SAMURAI ;
Yuanzhao Yao (author) (この著者で検索)
; ORCID SAMURAI ;
Takashi Sekiguchi (author) (この著者で検索)
キーワード
transmission electron microscopy, scanning electron microscopy, focused ion beam
刊行年月日
2025-08-01
更新時刻
2026-01-31 16:30:04 +0900
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