Defect engineering-induced Seebeck coefficient and carrier concentration decoupling in CuI by noble gas ion implantation

ジャーナル論文

著者

Martin Markwitz (author) (この著者で検索)

https://orcid.org/0009-0007-6516-3571 (unauthenticated)

Martin Markwitz ;

Peter P. Murmu (author) (この著者で検索)

https://orcid.org/0000-0002-0109-1798 (unauthenticated)

Peter P. Murmu ;

Takao Mori (author) (この著者で検索)

https://orcid.org/0000-0003-2682-1846

NIMS Researchers Directory SAMURAI

Takao Mori ;

John V. Kennedy (author) (この著者で検索)

https://orcid.org/0000-0002-9126-4997 (unauthenticated)

John V. Kennedy ;

Ben J. Ruck (author) (この著者で検索)

https://orcid.org/0000-0002-3719-7375 (unauthenticated)

Ben J. Ruck

キーワード

thermoelectric

刊行年月日

2024-11-18

更新時刻

2024-11-25 16:30:11 +0900