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Tajiri_JSynchrotronRad_32_2025_125-132.pdf
Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering
Journal article
Creator
Hiroo Tajiri (author) (Search by this author)
ORCID ; ORCID SAMURAI ;
Koji Kimura (author) (Search by this author)
ORCID ;
Sekhar Halubai (author) (Search by this author)
;
Haruto Morimoto (author) (Search by this author)
;
Naohisa Happo (author) (Search by this author)
ORCID ;
Jens R. Stellhorn (author) (Search by this author)
ORCID ; ORCID SAMURAI ;
Xvsheng Qiao (author) (Search by this author)
ORCID ;
Daisuke Urushihara (author) (Search by this author)
ORCID ;
Peidong Hu (author) (Search by this author)
;
Toru Wakihara (author) (Search by this author)
ORCID ;
Toyohiko Kinoshita (author) (Search by this author)
ORCID ;
Koichi Hayashi (author) (Search by this author)
ORCID
Keyword
X-ray diffractometers, element-specific measurements, X-ray fluorescence holography, anomalous X-ray scattering
Date published
2025-01-01
Updated at
2024-12-26 16:30:51 +0900

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