Direct Analysis of Stacked Au/Ti/In2O3/Al2O3/p+-Si Transport Mechanisms Using Operando Hard X-ray Photoelectron Spectroscopy
- ジャーナル論文
- 著者
-
Ibrahima Gueye (author) (この著者で検索)
https://orcid.org/0000-0001-5296-3894
(unauthenticated)
National Institute for Materials Science
;
Shigenori Ueda (author) (この著者で検索)National Institute for Materials Science
;
;Atsushi Ogura (author) (この著者で検索)Takahiro Nagata (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Operando, HAXPES, Interfaces, In2O3, Al2O3, Band bending, Chemical-structures
- 刊行年月日
- 2024-05-28
- 更新時刻
- 2025-05-15 08:30:10 +0900
Temperature- and depth-dependent valence band electronic structures of half-metallic studied by hard x-ray photoemission spectroscopy
- ジャーナル論文
- 著者
-
Shigenori Ueda (author) (この著者で検索)
;
Yuichi Fujita (author) (この著者で検索)
;
Ivan Kurniawan (author) (この著者で検索)
;
Yuya Sakuraba (author) (この著者で検索)
;
Yoshio Miura (author) (この著者で検索)
- キーワード
- Co2MnSi, HAXPES, Temperature dependence, Interface and bulk electronic states, interface and bulk magnetic properties, X-ray polarization dependence
- 刊行年月日
- 2026-02-18
- 更新時刻
- 2026-02-21 08:30:04 +0900
