Influence of Fermi level pinning on contact potential difference measurements using Kelvin probe force microscopy

ジャーナル論文

著者

Nobuyuki Ishida (author) (この著者で検索)

https://orcid.org/0000-0003-0161-0583

NIMS Researchers Directory SAMURAI

Nobuyuki Ishida

キーワード

Kelvin probe force microscopy, Simulation, Electrostatic force, Fermi level pinning

刊行年月日

2025-03-07

更新時刻

2025-03-10 16:30:14 +0900