キーワード: atom probe tomography
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2 件のレコードが見つかりました。

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An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam-Scanning Electron Microscopy.pdf
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI
キーワード
atom probe tomography, focused ion beam, scanning electron microscopy
刊行年月日
2025-02-03
更新時刻
2024-09-05 08:30:18 +0900
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing.pdf
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
ジャーナル論文
著者
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Jun Chen (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Ashutosh Kumar (author) (この著者で検索)
National Institute for Materials Science
ORCID ;
Wei Yi (author) (この著者で検索)
National Institute for Materials Science
ORCID ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Ryo Tanaka (author) (この著者で検索)
;
Shinya Takashima (author) (この著者で検索)
;
Masaharu Edo (author) (この著者で検索)
;
Kacper Sierakowski (author) (この著者で検索)
;
Michal Bockowski (author) (この著者で検索)
;
Hideki Sakurai (author) (この著者で検索)
;
Tetsu Kachi (author) (この著者で検索)
;
Takashi Sekiguchi (author) (この著者で検索)
National Institute for Materials Science
ORCID ;
Kazuhiro Hono (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
gallium nitride, implantation, atom probe tomography, cathodoluminescence, scanning transmission electron microscopy
刊行年月日
2022-05-14
更新時刻
2024-01-05 22:11:22 +0900
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