キーワード: X-ray diffraction
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4 件のレコードが見つかりました。 1件目から4件目まで表示します。

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Replica-exchange Bayesian mixture regression reveals cluster-dependent XRD descriptors of tensile modulus in recycled polypropylene-2.pdf
Replica-exchange Bayesian mixture regression reveals cluster-dependent XRD descriptors of tensile modulus in recycled polypropylene
ジャーナル論文
著者
Kazuki Hammura (author) (この著者で検索)
;
Kiyotaka Hitomi (author) (この著者で検索)
National Institute for Materials Science
ORCID ;
Kenji Nagata (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Masanobu Naito (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Recycled polypropylene, X-ray diffraction, Bayesian mixture regression, Bayesian peak deconvolution, structure–property relationship
刊行年月日
2026-12-31
更新時刻
2026-05-18 08:49:04 +0900
s41598-025-20384-0.pdf
Structural analysis of Si-doped amorphous In2O3 based on quantum beam measurements and computer simulations
ジャーナル論文
著者
Yuta Shuseki (author) (この著者で検索)
;
Akihiko Fujiwara (author) (この著者で検索)
;
Nobuhiko Mitoma (author) (この著者で検索)
;
Takio Kizu (author) (この著者で検索)
; ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ;
Atsunobu Masuno (author) (この著者で検索)
;
Koji Ohara (author) (この著者で検索)
; ORCID SAMURAI
キーワード
Amorphous indium oxide,, X-ray diffraction, Molecular dynamics simulation, Reverse Monte Carlo, Topological analysis, Thermal stability
刊行年月日
2025-10-21
更新時刻
2025-10-24 08:30:19 +0900
65_MT-M2023128.pdf
Phase Equilibria in Aluminium–Ruthenium–Silicon System near 1200 Kelvin
ジャーナル論文
著者
Koichi Kitahara (author) (この著者で検索)
;
Hiroyuki Takakura (author) (この著者で検索)
;
Yutaka Iwasaki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kaoru Kimura (author) (この著者で検索)
National Institute for Materials Science
ORCID
キーワード
aluminium–ruthenium–silicon system, phase equilibrium, crystal structure, X-ray diffraction, electron-probe X-ray microanalysis, incommensurate composite crystal, quasicrystal
刊行年月日
2024-01-01
更新時刻
2024-12-13 12:30:48 +0900
Rapid comprehensive search of crystalline phases from X-ray diffraction in seconds via GPU-accelerated Bayesian variational inference.pdf
Rapid, comprehensive search of crystalline phases from X-ray diffraction in seconds via GPU-accelerated Bayesian variational inference
ジャーナル論文
著者
Ryo Murakami (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kenji Nagata (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Yoshitaka Matsushita (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Masahiko Demura (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
X-ray diffraction, GPU computing, sparse modeling, bayesian inference, model selection
刊行年月日
2025-12-31
更新時刻
2025-07-26 08:30:18 +0900
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