First-principles insights into the atomic structure of carbon-nitrogen-oxygen complex color centers in silicon
- データセット
- 著者
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UDVARHELYI Peter (author) (この著者で検索)
https://orcid.org/0000-0002-7073-1664
(unauthenticated)
National Institute for Materials Science International Center for Young Scientists
- キーワード
- color center, quantum defect, first-principles calculation
- 刊行年月日
- 更新時刻
- 2026-08-19 16:44:51 +0900
Effect of Bidentate Ligand Additive in Tin Perovskite Solar Cells
- データセット
- 著者
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Dhruba B. Khadka (author) (この著者で検索)
;
Yasuhiro Shirai (author) (この著者で検索)
;
Masatoshi Yanagida (author) (この著者で検索)
;
Kenjiro Miyano (author) (この著者で検索)
- キーワード
- Sn-perovskite, Sn-oxidation, bidentate ligand, Stability, Device
- 刊行年月日
- 2023-06-11
- 更新時刻
- 2024-09-17 16:30:25 +0900
Machine learning prediction of coordination energies for alkali group elements in battery electrolyte solvents
- データセット
- 著者
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ISHIKAWA, Atsushi (author) (この著者で検索)
;
SODEYAMA, Keitaro (author) (この著者で検索)
;
IGARASHI, Yasuhiko (author) (この著者で検索)
https://orcid.org/0000-0003-1042-6657
(unauthenticated)
;
NAKAYAMA, Tomofumi (author) (この著者で検索)
https://orcid.org/0000-0003-1240-3571
(unauthenticated)
;
TATEYAMA, Yoshitaka (author) (この著者で検索)
;
OKADA, Masato (author) (この著者で検索)
https://orcid.org/0000-0002-9040-8784
(unauthenticated)
- キーワード
- quantum chemistry, electrolyte, battery
- 刊行年月日
- 2019-11-18
- 更新時刻
- 2024-01-05 22:13:39 +0900
Calculated crystal structures of formamidinium–lead–chloride–dimethyl sulfoxide and related compounds
- データセット
- 著者
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Noriko Saito (author) (この著者で検索)Research Center for Functional Materials/Electric and Electronic Materials Field/Ceramics Surface and Interface Group
;
Yoshitaka Matsushita (author) (この著者で検索)Research Network and Facility Services Division/Materials Analysis Station
;
Takeo Ohsawa (author) (この著者で検索)Research Center for Functional Materials/Electric and Electronic Materials Field/Electroceramics Group
;
Hiroyo Segawa (author) (この著者で検索)Research Center for Functional Materials/Electric and Electronic Materials Field/Electroceramics Group
;
Naoki Ohashi (author) (この著者で検索)Research Center for Functional Materials/Electric and Electronic Materials Field/Electroceramics Group
- キーワード
- hybrid halide, formamidinium, dimethyl sulfoxide (DMSO), lead halide
- 刊行年月日
- 2022-11-03
- 更新時刻
- 2024-01-05 22:13:14 +0900
A material dictionary database to extract information on permanent magnets from scientific articles
- データセット
- 著者
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Akira Suzuki (author) (この著者で検索)National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
- キーワード
- database, magnetic property, materials informatics, natural language processing, ontology, information extraction
- 刊行年月日
- 更新時刻
- 2023-01-31 22:30:50 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900