NF3 and F2 gas fluorination of GaN surface and Pt/GaN interface analyzed by hard X-ray photoelectron spectroscopy
- ジャーナル論文
- 著者
-
Asahiko Matsuda (author) (この著者で検索)National Institute for Materials Science
;
Takashi Teramoto (author) (この著者で検索)
https://orcid.org/0000-0002-9368-1284
(unauthenticated)
;
Takahiro Nagata (author) (この著者で検索)National Institute for Materials Science
;
Dominic Gerlach (author) (この著者で検索)
https://orcid.org/0000-0003-1859-0750
(unauthenticated)
;
Peng Shen (author) (この著者で検索)
https://orcid.org/0000-0002-1971-5490
(unauthenticated)
;
Shigenori Ueda (author) (この著者で検索)National Institute for Materials Science
;
;Takako Kimura (author) (この著者で検索);Christian Dussarrat (author) (この著者で検索)Toyohiro Chikyow (author) (この著者で検索)
- キーワード
- Fluorination, Surface passivation, hard X-ray photoelectron spectroscopy, Gallium nitride
- 刊行年月日
- 2024-03-19
- 更新時刻
- 2026-03-19 14:27:24 +0900
Ameliorating Defects in Wide Bandgap Tin Perovskite Solar Cells Using Fluorinated Solvent and Hydrazide
- ジャーナル論文
- 著者
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Dhruba B. Khadka (author) (この著者で検索)
;
Yasuhiro Shirai (author) (この著者で検索)
;
Ryoji Sahara (author) (この著者で検索)
;
Masatoshi Yanagida (author) (この著者で検索)
;
Kenjiro Miyano (author) (この著者で検索)
- キーワード
- Wide bandgap tin perovskite, Lead-free, Tin oxidation, Device stability, Surface passivation, Pb-free Tandem device
- 刊行年月日
- 2024-12-15
- 更新時刻
- 2025-12-19 08:31:22 +0900