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MDR lattice thermal conductivity calculation database(4811)
MDR XAFS DB(2046)
Lattice thermal conductivity calculation datasets for 103 binary compounds by finite displacement method (PBE)(70)
Lattice thermal conductivity calculation datasets for 103 binary compounds by finite displacement method(70)
FGMs Database(64)
MDR HAXPES DB(37)
PoLyInfo Knowledge Collection(5)
SuperCon Knowledge Collection(3)
MDR SuperCon Datasheet(2)
The history of DICE and NIMS Digital Library(1)
資源タイプ
データセット(7140)
キーワード
Lattice thermal conductivity (4811)
XAFS (2046)
collection - MDR XAFS DB (2046)
SPring-8 (1793)
BL14B2 (1756)
Si(111) (1213)
Si(311) (758)
Oxide (346)
Chloride (225)
Oxide_ate (200)
(more)
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Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (1)
http://creativecommons.org/publicdomain/zero/1.0/ (1)
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http://opensource.org/licenses/MIT (1)
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image/png (6895)
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text/x-log (4811)
application/octet-stream (2089)
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text/tab-separated-values (2083)
text/plain (1767)
application/xml (1581)
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet (68)
application/zip (60)
試料の化学組成
SUS316L (18)
銅 (12)
プラチナ (12)
タングステン酸バリウム (11)
タングステン酸銀 (9)
タングステン酸コバルト (9)
タングステン酸銅 (9)
タングステン酸ニッケル (9)
タングステン酸亜鉛 (9)
金 (8)
計算手法
https://matvoc.nims.go.jp/entity/Q21 (1)
解析分野
分光法 (2046)
計測法
X線吸収分光法 (2046)
X線光電子分光法 (1)
試料種別
酸化物 (335)
塩化物 (225)
純金属 (145)
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遷移金属合金 (93)
臭化物 (86)
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試料の構造的特徴
局所構造 (2046)
資源タイプ: データセット
全ての絞り込みを解除
7140 件のレコードが見つかりました。
Dynamical visualization of attractively interacting single vortices in type-II/1 superconducting Nb by magneto-optical imaging
データセット
著者
S. Ooi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2129-0310
National Institute for Materials Science International Center for Materials Nanoarchitectonics
NIMS Researchers Directory SAMURAI
S. Ooi
;
M. Tachiki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-6033-3515
National Institute for Materials Science International Center for Materials Nanoarchitectonics
NIMS Researchers Directory SAMURAI
M. Tachiki
;
T. Mochiku
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2208-4279
National Institute for Materials Science International Center for Materials Nanoarchitectonics
NIMS Researchers Directory SAMURAI
T. Mochiku
;
H. Ito
(author) (
この著者で検索
)
High Energy Accelerator Research Organization
H. Ito
;
T. Kubo
(author) (
この著者で検索
)
High Energy Accelerator Research Organization
T. Kubo
;
A. Kikuchi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5044-7156
National Institute for Materials Science Research Center for Energy and Environmental Materials (GREEN)
NIMS Researchers Directory SAMURAI
A. Kikuchi
;
S. Arisawa
(author) (
この著者で検索
)
https://orcid.org/0000-0001-8155-9401
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
S. Arisawa
;
K. Umemori
(author) (
この著者で検索
)
High Energy Accelerator Research Organization
K. Umemori
キーワード
vortex
,
superconductivity
,
niobium
,
type-II/1 superconductor
,
magneto-optical imaging
刊行年月日
更新時刻
2025-03-31 16:40:34 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:11:29 +0900
Quantifying the Thresholds of the Phospholipid Surface Density for Nonspecific Protein Adsorption and Desorption at the Triacylglycerol/Water Interface
データセット
著者
Chiho Kataoka-Hamai
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4068-0405
NIMS Researchers Directory SAMURAI
Chiho Kataoka-Hamai
キーワード
Lipid droplets
,
triacylglycerol
,
oil/water interface
,
protein
刊行年月日
2025-09-23
更新時刻
2025-09-24 16:30:26 +0900
キーワード
Lattice thermal conductivity
(4811)
XAFS
(2046)
collection - MDR XAFS DB
(2046)
SPring-8
(1793)
BL14B2
(1756)
Si(111)
(1213)
Si(311)
(758)
Oxide
(346)
Chloride
(225)
Oxide_ate
(200)
Alloy
(174)
Pure metal
(149)
Phonon
(140)
Photon Factory
(136)
Ni K-edge
(98)
Sulfide
(94)
Transition metal alloy
(93)
W L21-edge
(92)
Fe K-edge
(88)
Bromide
(86)
Fluoride
(83)
Cu K-edge
(79)
Co K-edge
(78)
Ritsumeikan-SR
(75)
Sulfate
(75)
Metalloid alloy
(73)
Aichi SR
(72)
Zn K-edge
(72)
Nitrate
(71)
BL5S1
(64)
Tungstate
(64)
functionally graded materials
(64)
Ba L21-edge
(60)
Pb L21-edge
(60)
Ag K-edge
(59)
Zr K-edge
(58)
BL-9C
(57)
Hydroxide
(52)
BL-10
(51)
Iodide
(51)
W L3-edge
(51)
Mo K-edge
(49)
Boride
(47)
In K-edge
(47)
Nb K-edge
(44)
Ta L21-edge
(44)
Nitride
(42)
Sn K-edge
(42)
Silicide
(41)
Cr K-edge
(40)
La L21-edge
(40)
Carbonate
(39)
Ti K-edge
(38)
BL46XU
(37)
HAXPES
(37)
collection - MDR HAXPES DB
(37)
Mn K-edge
(36)
Pd K-edge
(36)
Organometal
(35)
Oxalate
(34)
Titanate
(34)
Acetate
(33)
BL-12C
(32)
Carbide
(32)
Molybdate
(32)
Pb L3-edge
(32)
Ba K-edge
(31)
Ba L3-edge
(31)
Ru K-edge
(31)
Sb K-edge
(31)
AR-NW10A
(30)
Er L21-edge
(28)
Ir L21-edge
(28)
Hydride
(27)
Ce L21-edge
(26)
Phosphate
(26)
Cs L21-edge
(24)
Pt L3-edge
(24)
Ta L3-edge
(24)
W K-edge
(23)
La K-edge
(20)
La L3-edge
(20)
Yb L21-edge
(20)
Zirconate
(20)
Au L3-edge
(19)
V K-edge
(19)
Eu L21-edge
(18)
Ir L3-edge
(18)
Rh K-edge
(18)
SUS316L
(18)
Acetylacetonate
(17)
BL-9A
(17)
Ce K-edge
(17)
Phosphorate
(17)
Au L1-edge
(16)
Au L2-edge
(16)
Pt L1-edge
(16)
Pt L2-edge
(16)
Tb L21-edge
(16)
S K-edge
(15)
Tungsten carbide
(15)
Ce L3-edge
(14)
Er L3-edge
(14)
Tantalum boride
(14)
Tantalum nitride
(14)
Cs L3-edge
(13)
Cu
(13)
Chlorate
(12)
Copper
(12)
Cs K-edge
(12)
Platinum
(12)
Pt
(12)
BaWO4
(11)
Barium tungstate
(11)
Ca K-edge
(11)
Metal acid
(11)
Ta K-edge
(11)
ZrO2
(11)
Al K-edge
(10)
BL-11
(10)
Eu L3-edge
(10)
Niobate
(10)
Phthalocyanine
(10)
Si K-edge
(10)
WS2
(10)
Yb L3-edge
(10)
Ag2WO4
(9)
Au
(9)
CoWO4
(9)
Cobalt tungstate
(9)
Copper tungstate
(9)
CuWO4
(9)
Er2S3
(9)
Eu K-edge
(9)
Hexafluoride
(9)
Ir
(9)
Nd K-edge
(9)
Nd L1-edge
(9)
Nd L2-edge
(9)
Nd L3-edge
(9)
NiWO4
(9)
Nickel tungstate
(9)
PtO2
(9)
Silicate
(9)
Silver(I) tungstate
(9)
Ta
(9)
Ta2O5
(9)
Vanadate
(9)
W
(9)
Zinc tungstate
(9)
ZnWO4
(9)
Zr
(9)
Auger depth profiling analysis
(8)
BL11S2
(8)
CeO2
(8)
Chromate
(8)
Er2O3
(8)
ErF3
(8)
F K-edge
(8)
Fe
(8)
FeWO4
(8)
Gold
(8)
HfO2/Si
(8)
IrO2
(8)
Iridium
(8)
Iridium(IV) oxide
(8)
Iron tungstate
(8)
KAuCl4
(8)
Lanthanoid alloy
(8)
Lead zirconate
(8)
Pb
(8)
PbF2
(8)
PbO
(8)
PbZrO3
(8)
Pd
(8)
Pyrophosphate
(8)
Ta3N5
(8)
Tantalum
(8)
Tantalum(V) oxide
(8)
Tb K-edge
(8)
Tb L3-edge
(8)
Tungsten
(8)
Tungsten sulfide
(8)
Tungsten(IV) oxide
(8)
Tungsten(VI) oxide
(8)
Ultra low angle incidence ion beam
(8)
WC
(8)
WO2
(8)
WO3
(8)
WSe2
(8)
Zinc antimonide
(8)
Zirconium
(8)
Zn
(8)
ZnS
(8)
BL-13
(7)
BL-2
(7)
BL11
(7)
BaCO3
(7)
BaCl2
(7)
BaF2
(7)
RDEメタデータ定義
RDE送り状
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