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MDR lattice thermal conductivity calculation database(4811)
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Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:11:29 +0900
Evaluation of spin mixing conductance in Co2FeGa0.5Ge0.5/Pt bilayer and the effect of ultrathin Cu, Ni, Ru, Ta, or Cr insertion layers
データセット
著者
Madhav Mohan Bhat
(author) (
この著者で検索
)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
Madhav Mohan Bhat
;
Hirofumi Suto
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4387-5862
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
NIMS Researchers Directory SAMURAI
Hirofumi Suto
;
Taisuke T. Sasaki
(author) (
この著者で検索
)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
Taisuke T. Sasaki
;
Alagarsamy Perumal
(author) (
この著者で検索
)
Indian Institute of Technology (IIT) Guwahati
Alagarsamy Perumal
;
Ananthakrishnan Srinivasan
(author) (
この著者で検索
)
Indian Institute of Technology (IIT) Guwahati
Ananthakrishnan Srinivasan
;
Yuya Sakuraba
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4618-9550
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
NIMS Researchers Directory SAMURAI
Yuya Sakuraba
キーワード
Spin pumping
,
Magnetization dynamics
,
Spin current
,
Ferromagnetic resonance
,
Half-metals
,
Heusler alloy
,
Magnetic thin films
刊行年月日
更新時刻
2026-07-14 15:41:13 +0900
Supplemental data to 'A unified model for metallic materials reliability data and its application in NIMS Metallic Materials Database (Kinzoku)'
データセット
著者
Asahiko Matsuda
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5989-027X
National Institute for Materials Science Research Network and Facility Services Division
NIMS Researchers Directory SAMURAI
Asahiko Matsuda
;
Masahiko Demura
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7308-3041
National Institute for Materials Science Research Network and Facility Services Division
NIMS Researchers Directory SAMURAI
Masahiko Demura
;
Masayoshi Yamazaki
(author) (
この著者で検索
)
National Institute for Materials Science
Masayoshi Yamazaki
;
Takuya Kadohira
(author) (
この著者で検索
)
https://orcid.org/0000-0003-0569-1309
National Institute for Materials Science Research Network and Facility Services Division
NIMS Researchers Directory SAMURAI
Takuya Kadohira
;
Toshihiro Ashino
(author) (
この著者で検索
)
https://orcid.org/0009-0002-9592-8516
(unauthenticated)
Toyo University Faculty of Regional Development Studies
Toshihiro Ashino
;
Yoshiyuki Furuya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-3039-5280
National Institute for Materials Science Research Center for Structural Materials
NIMS Researchers Directory SAMURAI
Yoshiyuki Furuya
;
Kota Sawada
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7780-1648
National Institute for Materials Science Research Center for Structural Materials
NIMS Researchers Directory SAMURAI
Kota Sawada
;
Nobutaka Nishikawa
(author) (
この著者で検索
)
Mizuho Research & Technologies, Ltd.
Nobutaka Nishikawa
キーワード
metallic materials
,
structural materials
,
database
,
data format
,
data model
,
creep
,
fatigue
刊行年月日
2025-12-31
更新時刻
2025-08-01 08:55:21 +0900
キーワード
Lattice thermal conductivity
(4811)
Fe K-edge
(25)
XAFS
(25)
collection - MDR XAFS DB
(25)
Si(111)
(24)
Photon Factory
(22)
BL-9C
(16)
Auger depth profiling analysis
(8)
HfO2/Si
(8)
Ultra low angle incidence ion beam
(8)
BiOF
(7)
Oxide
(7)
Alloy
(6)
Ontology
(6)
SUS316L
(6)
Transition metal alloy
(6)
ZrO2
(6)
Al(HO)3
(5)
Al2O3
(5)
AlHO2
(5)
Fe
(5)
HfO2
(5)
Iron
(5)
Na2Si2O5
(5)
Pure metal
(5)
RDF
(5)
SiO2
(5)
SuperCon
(5)
TiO2
(5)
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(4)
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(4)
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(4)
CdI2
(4)
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(4)
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(4)
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(4)
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(4)
Na3CuO2
(4)
Rb2O
(4)
SPARQL
(4)
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(4)
Semantic Web
(4)
Superconductors
(4)
Y2Si2O7
(4)
BL-12C
(3)
BL-9A
(3)
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(3)
Ba2SrI6
(3)
BaCl2
(3)
BaLa2O4
(3)
Ca3(AlN2)2
(3)
Ca3N2
(3)
Ca4Ta2O9
(3)
CdP2
(3)
CuI
(3)
Dy2S3
(3)
K2LiAlF6
(3)
K2O
(3)
K2PbO3
(3)
KHO
(3)
KSbO3
(3)
La2O3
(3)
Li3CuS2
(3)
LiAgF4
(3)
LiBeH3
(3)
LiI
(3)
LiSbO3
(3)
LiYF4
(3)
Lu2GeO5
(3)
MgAl2O4
(3)
MgGeO3
(3)
Na2SnO3
(3)
Na2UO4
(3)
NaLaO2
(3)
NaLuO2
(3)
NaTmO2
(3)
NdTaO4
(3)
PbI2
(3)
Rb2GeF6
(3)
Rh2O3
(3)
ScHO2
(3)
SmAsO4
(3)
SmTaO4
(3)
SnO2
(3)
Sr2CaI6
(3)
SrCa2I6
(3)
SrLu2O4
(3)
SrSc2O4
(3)
Tm2GeO5
(3)
Tm2S3
(3)
Y2HfO5
(3)
ZnP2
(3)
ZnS
(3)
Zr3N4
(3)
Ac2S3
(2)
AgBr
(2)
AgCl
(2)
Al2CdSe4
(2)
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(2)
Al5C3N
(2)
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(2)
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(2)
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(2)
AlF3
(2)
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(2)
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(2)
Ar
(2)
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(2)
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(2)
Ba(H2O3)2
(2)
Ba2GeO4
(2)
Ba2LaCl7
(2)
Ba2Si3O8
(2)
Ba2Ti6N2O11
(2)
Ba3(SnP2)2
(2)
Ba4Sn3O10
(2)
BaBe2Si2O7
(2)
BaCO3
(2)
BaCa2I6
(2)
BaF2
(2)
BaI2
(2)
BaLiP
(2)
BaLu2O4
(2)
BaTm2O4
(2)
BaYF5
(2)
BaZnCl4
(2)
BaZrF6
(2)
Be3N2
(2)
BeO
(2)
Bi3BrO4
(2)
BiAsO4
(2)
Ca(BO2)2
(2)
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(2)
Ca2SiO4
(2)
Ca2SnS4
(2)
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(2)
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(2)
CaAlF5
(2)
CaC2
(2)
CaCl2
(2)
CaPbI4
(2)
CaSO4
(2)
CaSeO3
(2)
CaSnO3
(2)
CaTiO3
(2)
Cd(HO)2
(2)
Cd2P3Cl
(2)
CdBr2
(2)
CdGe(BiO3)2
(2)
CdGeO3
(2)
CdS
(2)
CdSe
(2)
CdSeO4
(2)
CdSnO3
(2)
CdTe
(2)
CoAsS
(2)
Cs2MgH4
(2)
Cs2PtF6
(2)
CsAlF4
(2)
CsBr
(2)
CsCl
(2)
CsDyS2
(2)
CsMgH3
(2)
CsPrS2
(2)
CsSn
(2)
Cu3SbS3
(2)
CuBr
(2)
CuCl
(2)
Dy2O3
(2)
Dy2SO2
(2)
Dy2SiO5
(2)
DyGaO3
(2)
DyHO2
(2)
DyTaO4
(2)
Er2S3
(2)
Er2Si2O7
(2)
Er2SiO5
(2)
Er2TeO2
(2)
ErNbO4
(2)
ErTaO4
(2)
Fe3O4
(2)
FeO
(2)
FeP4
(2)
FeS2
(2)
Ferromagnetic resonance
(2)
Ga2O3
(2)
GaCuO2
(2)
GaHO2
(2)
GaP
(2)
GaSe
(2)
GaTe
(2)
Gallium nitride
(2)
GeO2
(2)
H4BrN
(2)
Half-metals
(2)
Heusler alloy
(2)
Hf2P2O9
(2)
Hf3N2O3
(2)
Hf3N4
(2)
HfZrO4
(2)
RDEメタデータ定義
RDE送り状
<
1
2
3
4
5
…
487
>
絞り込み
コレクション
MDR lattice thermal conductivity calculation database(4811)
MDR XAFS DB(25)
SuperCon Knowledge Collection(5)
PoLyInfo Knowledge Collection(2)
READS: Database of Promising Adsorbents for Decontamination of Radioactive Substances(1)
READS: 放射性物質の除去・回収技術のためのデータベース(1)
資源タイプ
データセット(4870)
キーワード
Lattice thermal conductivity (4811)
Fe K-edge (25)
XAFS (25)
collection - MDR XAFS DB (25)
Si(111) (24)
Photon Factory (22)
BL-9C (16)
Auger depth profiling analysis (8)
HfO2/Si (8)
Ultra low angle incidence ion beam (8)
(more)
ライセンス
Creative Commons BY Attribution 4.0 International (4830)
Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International (22)
In Copyright (8)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (2)
ファイル種別
image/png (4838)
application/x-xz (4811)
text/x-log (4811)
application/octet-stream (28)
application/json (25)
text/tab-separated-values (25)
application/zip (19)
application/pdf (17)
text/plain (7)
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet (3)
試料の化学組成
SUS316L (6)
鉄 (5)
酸化鉄(III)(ヘマタイト) (2)
酸化鉄(II,III)(マグネタイト) (2)
酸化鉄(II) (2)
α-オキシ水酸化鉄 (1)
酢酸鉄(III)(塩基性) (1)
γ-オキシ水酸化鉄(III) (1)
鉄(III)アセチルアセトナート (1)
リン酸鉄(II)リチウム (1)
計算手法
密度汎関数理論または電子構造 (1)
解析分野
分光法 (25)
計測法
X線吸収分光法 (25)
X線光電子分光法 (2)
試料種別
酸化物 (7)
遷移金属合金 (6)
純金属 (5)
水酸化物 (2)
アセチルアセトナート (1)
テトラエチルアンモニウム (1)
金属・合金 (1)
酢酸塩 (1)
有機金属 (1)
リン酸塩 (1)
試料の構造的特徴
局所構造 (25)
装置名
BL-9C_XAFS (16)
BL-12C_XAFS (3)
BL-9A_XAFS (3)
BL14B2_XAFS (2)
BL23_XPS (2)
B-H tracer (1)
Carl Zeiss Crossbeam 1540 EsB FIB/SEM (1)
SPring-8 BL20B2 (1)
Unspecified (1)
装置型番
(3)