Classification for transmission electron microscope images from different amorphous states using persistent homology
- ジャーナル論文
- 著者
-
Fumihiko Uesugi (author) (この著者で検索)National Institute for Materials Science
;
Masashi Ishii (author) (この著者で検索)National Institute for Materials Science
- キーワード
- TEM image simulation, GaN, persistent homology, Amorphous structure
- 刊行年月日
- 2022-06-06
- 更新時刻
- 2024-07-04 16:32:11 +0900
Communication—A Powerful Method to Improve Dielectric/GaN Interface Properties: A Dummy SiO2 Process
- ジャーナル論文
- 著者
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Yoshihiro Irokawa (author) (この著者で検索)National Institute for Materials Science
;
Toshihide Nabatame (author) (この著者で検索)National Institute for Materials Science
;
;Tomomi Sawada (author) (この著者で検索)National Institute for Materials Science;Manami Miyamoto (author) (この著者で検索);Hiromi Miura (author) (この著者で検索)Kazuhito Tsukagoshi (author) (この著者で検索)National Institute for Materials Science
;
Yasuo Koide (author) (この著者で検索)National Institute for Materials Science
- キーワード
- GaN
- 刊行年月日
- 2024-08-01
- 更新時刻
- 2024-09-02 12:30:27 +0900
Heat transport exploration through the GaN/diamond interfaces using machine learning potential
- ジャーナル論文
- 著者
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;Zhanpeng Sun (author) (この著者で検索);Yunfei Song (author) (この著者で検索);Zijun Qi (author) (この著者で検索);Xiang Sun (author) (この著者で検索)Meiyong Liao (author) (この著者で検索)National Institute for Materials Science
;
;Rui Li (author) (この著者で検索)Qijun Wang (author) (この著者で検索)
https://orcid.org/0000-0002-4299-3798
(unauthenticated)
;
;Lijie Li (author) (この著者で検索)Gai Wu (author) (この著者で検索)
https://orcid.org/0000-0002-9726-6328
(unauthenticated)
;
;Wei Shen (author) (この著者で検索)Sheng Liu (author) (この著者で検索) - キーワード
- thermal conductivity, GaN, Diamond
- 刊行年月日
- 2025-01-16
- 更新時刻
- 2025-04-22 12:30:10 +0900
Vacancy-type defects introduced by mechanical polishing in ammonothermal GaN studied by a monoenergetic positron beam
- ジャーナル論文
- 著者
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Akira Uedono (author) (この著者で検索)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
;
Shoji Ishibashi (author) (この著者で検索)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
;
Kohei Shima (author) (この著者で検索)
https://orcid.org/0000-0003-0967-141X
(unauthenticated)
;
;Shigefusa F. Chichibu (author) (この著者で検索)Kacper Sierakowski (author) (この著者で検索)
https://orcid.org/0000-0002-9447-1182
(unauthenticated)
;
Makoto Oishi (author) (この著者で検索)
https://orcid.org/0000-0003-3402-4556
(unauthenticated)
;
Noriyuki Okada (author) (この著者で検索)
https://orcid.org/0009-0002-0090-5646
(unauthenticated)
;
Takuro Nagai (author) (この著者で検索)
;
Michal Bockowski (author) (この著者で検索)
https://orcid.org/0000-0003-1616-685X
(unauthenticated)
- キーワード
- Mechanical polishing, GaN, Vacancy, Defect, Positron annihilation
- 刊行年月日
- 2026-04-12
- 更新時刻
- 2026-04-20 08:56:29 +0900
Local defect and mid-gap state analysis of GaN using monochromated EELS combined with nanodiffraction and atomic-resolution imaging
- ジャーナル論文
- 著者
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Shunsuke Yamashita (author) (この著者で検索)
https://orcid.org/0000-0003-1702-1708
(unauthenticated)
;
;Sei Fukushima (author) (この著者で検索)Jun Kikkawa (author) (この著者で検索)National Institute for Materials Science (NIMS) Center for Basic Research on Materials
;
;Ryoji Arai (author) (この著者で検索)Yuya Kanitani (author) (この著者で検索)
https://orcid.org/0009-0002-2154-5571
(unauthenticated)
;
Koji Kimoto (author) (この著者で検索)National Institute for Materials Science (NIMS) Center for Basic Research on Materials
;
Yoshihiro Kudo (author) (この著者で検索)
- キーワード
- defect, GaN, EELS, 4D-STEM, HAADF-STEM, ABF-STEM, HAXPES
- 刊行年月日
- 2024-03-01
- 更新時刻
- 2024-03-19 16:56:29 +0900