- MDR phonon calculation database(10025)
- MDR lattice thermal conductivity calculation database(4810)
- MDR XAFS DB(2103)
- Thermophysical Property Original Datasets(265)
- Lattice thermal conductivity calculation datasets for 103 binary compounds by finite displacement method (PBE)(103)
- Lattice thermal conductivity calculation datasets for 103 binary compounds by finite displacement method(103)
- 無機材研ニュース(41)
- FGMs Database(40)
- 金材技研ニュース(39)
- MDR HAXPES DB(37)
- Creative Commons BY Attribution 4.0 International (18299)
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- Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (367)
- Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International (252)
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Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:25 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Original dataset for ID 211 Ni-50at%Ti in Thermophysical Property Database
- データセット
- コレクション
- Thermophysical Property Original Datasets
- 著者
-
;Takehiko Ishikawa (depositor) (この著者で検索)Japan Aerospace Exploration AgencyMasashi Ishii (editor) (この著者で検索)National Institute for Materials Science
- キーワード
- Ni-50at%Ti, Alloy, Density, VELF, Electrostatic Levitation, collection - Thermophys Datasets
- 刊行年月日
- 更新時刻
- 2024-03-30 18:38:09 +0900
Original dataset for ID 173 Zr80O20 in Thermophysical Property Database
- データセット
- コレクション
- Thermophysical Property Original Datasets
- 著者
-
;Takehiko Ishikawa (depositor) (この著者で検索)Japan Aerospace Exploration AgencyMasashi Ishii (editor) (この著者で検索)National Institute for Materials Science
- キーワード
- Zr80O20, Ceramic, Density, VELF, Electrostatic Levitation, collection - Thermophys Datasets
- 刊行年月日
- 更新時刻
- 2024-03-30 18:38:11 +0900
XAFS spectrum of Cesium sulfate, anhydrous
- データセット
- コレクション
- MDR XAFS DB
- 著者
-
Masashi Ishii (editor) (この著者で検索)National Institute for Materials Science
;
Industrial Application and Partnership Division (author) (この著者で検索)Japan Synchrotron Radiation Research Institute
- キーワード
- collection - MDR XAFS DB, XAFS, SPring-8, BL14B2, Si(311), Cs2SO4, Cs K-edge, Sulfate, Cesium sulfate, anhydrous
- 刊行年月日
- 2021-07-23
- 更新時刻
- 2025-05-02 21:46:53 +0900
Original dataset for ID 155 Zr80O20 in Thermophysical Property Database
- データセット
- コレクション
- Thermophysical Property Original Datasets
- 著者
-
;Takehiko Ishikawa (depositor) (この著者で検索)Japan Aerospace Exploration AgencyMasashi Ishii (editor) (この著者で検索)National Institute for Materials Science
- キーワード
- Zr80O20, Ceramic, Density, VELF, Electrostatic Levitation, collection - Thermophys Datasets
- 刊行年月日
- 更新時刻
- 2024-03-30 18:38:04 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
XAFS spectrum of Cesium iodide, anhydrous
- データセット
- コレクション
- MDR XAFS DB
- 著者
-
Masashi Ishii (editor) (この著者で検索)National Institute for Materials Science
;
Industrial Application and Partnership Division (author) (この著者で検索)Japan Synchrotron Radiation Research Institute
- キーワード
- collection - MDR XAFS DB, XAFS, SPring-8, BL14B2, Si(311), CsI, Cs K-edge, Iodide, Cesium iodide, anhydrous
- 刊行年月日
- 2021-07-24
- 更新時刻
- 2025-05-02 22:05:37 +0900