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Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:11:29 +0900
English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
- ジャーナル論文
- 著者
-
Ogiwara, Toshiya (author) (この著者で検索)
;
Nagata, Takahiro (author) (この著者で検索)
;
Yoshikawa, Hideki (author) (この著者で検索)
- キーワード
- Auger Depth Profiling Analysis, HfO2/Si, Ultra Low Angle Incidence Ion Beam
- 刊行年月日
- 2020-06-04
- 更新時刻
- 2022-10-03 01:48:14 +0900
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
- ジャーナル論文
- 著者
-
Yoshikawa, Hideki (author) (この著者で検索)
;
Ogiwara, Toshiya (author) (この著者で検索)
;
Nagata, Takahiro (author) (この著者で検索)
- キーワード
- Auger Depth Profiling analysis, HfO2/Si, Ultra Low Angle Incidence Ion Beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:11:28 +0900
Novel Bayesian Statistical Analysis on Acoustic Emission Data during Dwell-fatigue of Ti-6Al-4V Alloys
- ジャーナル論文
- 著者
-
Haoyu Hu (author) (この著者で検索)
https://orcid.org/0000-0002-7361-8720
(unauthenticated)
;
Fabien Briffod (author) (この著者で検索)
;
Takayuki Shiraiwa (author) (この著者で検索)
https://orcid.org/0000-0002-0999-0798
(unauthenticated)
;
Manabu Enoki (author) (この著者で検索)
https://orcid.org/0000-0001-6929-114X
(unauthenticated)
- キーワード
- Ti-6Al-4V, Dwell-fatigue, Acoustic emission, Strain accumulation, Bayesian statistics
- 刊行年月日
- 2025-09-15
- 更新時刻
- 2025-10-01 16:30:33 +0900
Oxidation Properties of Additively Manufactured High Entropy Alloys: A Short Review
- ジャーナル論文
- 著者
-
;Jhuo-Lun Lee (author) (この著者で検索);An-Chou Yeh (author) (この著者で検索)Hideyuki Murakami (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Oxidation properties, Additive manufacturing, High entropy alloys
- 刊行年月日
- 2024-09-23
- 更新時刻
- 2025-09-23 08:30:15 +0900
Advancing refractory high entropy alloy development with AI-predictive models for high temperature oxidation resistance
- ジャーナル論文
- 著者
-
Stéphane Gorsse (author) (この著者で検索)
https://orcid.org/0000-0003-1966-8476
(unauthenticated)
;
;Wei-Chih Lin (author) (この著者で検索)Hideyuki Murakami (author) (この著者で検索)National Institute for Materials Science
;
Gian-Marco Rignanese (author) (この著者で検索)
https://orcid.org/0000-0002-1422-1205
(unauthenticated)
;
An-Chou Yeh (author) (この著者で検索)
https://orcid.org/0000-0002-9460-8345
(unauthenticated)
- キーワード
- Refractory high entropy alloys, Oxidation resistance, AI model
- 刊行年月日
- 2024-10-01
- 更新時刻
- 2024-10-09 08:30:56 +0900