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643 件のレコードが見つかりました。 631件目から640件目まで表示します。
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:11:29 +0900
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
- ジャーナル論文
- 著者
-
Yoshikawa, Hideki (author) (この著者で検索)
;
Ogiwara, Toshiya (author) (この著者で検索)
;
Nagata, Takahiro (author) (この著者で検索)
- キーワード
- Auger Depth Profiling analysis, HfO2/Si, Ultra Low Angle Incidence Ion Beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:11:28 +0900
Creep deformation mechanism of LPBFed near α, and near β-Ti alloys
- プレゼンテーション
- 著者
-
;Yoko Yamabe-Mitarai (author) (この著者で検索)Department of Advanced Material Science, Graduate School of Frontier Sciences, The University of TokyoYoshiaki Toda (author) (この著者で検索)National Institute for Materials Science Center for Basic Research on Materials/Data-driven Materials Research Field/Materials Modeling Group
;
;Tetsuya Matsunaga (author) (この著者で検索)JAXA;Ryosuke Ozasa( (author) (この著者で検索)Graduate School of Engineering, Osaka University;Takuya Ishimoto (author) (この著者で検索)University of Toyama;Tsutomu Ito (author) (この著者で検索)Toyama Prefectural UniversityTakayoshi Nakano (author) (この著者で検索)Graduate School of Engineering, Osaka University
- キーワード
- Ti-6Al-4Nb-4Zr, Ti-6Al-2Sn-4Zr-6Mo, Laser powder bed fusion, Alpha formation, Creep strength, Volume energy density, Crystallographic orientation
- 刊行年月日
- 更新時刻
- 2026-05-13 11:42:27 +0900
Dynamic evaluation in motors of variable magnetic flux magnets
- 会議発表ポスター
- コレクション
- The 28th International Workshop on Rare Earth and Future Permanent Magnets and Their Applications (REPM2025)
- 著者
-
;Kenji Takeda (author) (この著者で検索)Technology and Intellectual Property HQ, TDK Corporation, Japan;R. Fujiwara (author) (この著者で検索)Technology and Intellectual Property HQ, TDK Corporation, Japan;T. Shinji (author) (この著者で検索)Technology and Intellectual Property HQ, TDK Corporation, Japan;S. Miyazaki (author) (この著者で検索)Technology and Intellectual Property HQ, TDK Corporation, Japan;T. Kajita (author) (この著者で検索)Technology and Intellectual Property HQ, TDK Corporation, Japan;Y. Enokido (author) (この著者で検索)Technology and Intellectual Property HQ, TDK Corporation, JapanK. Akatsu (author) (この著者で検索)Department of Faculty of Engineering, Yokohama National University, Japan
- キーワード
- REPM2025, motors
- 刊行年月日
- 更新時刻
- 2025-09-11 16:31:05 +0900