7076 件のレコードが見つかりました。

MDR-Ir2B3-x_manuscript_8Jul24-1.docx
Crystal structures, bonding and electronic structures of α- and β-Ir2B3−x compounds
ジャーナル論文
著者
Oksana Sologub (author) (この著者で検索)
ORCID ;
Leonid P. Salamakha (author) (この著者で検索)
ORCID ;
Berthold Stöger (author) (この著者で検索)
ORCID ; ORCID SAMURAI ;
Neven Barisic (author) (この著者で検索)
ORCID ;
Peter F. Rogl (author) (この著者で検索)
ORCID ;
Herwig Michor (author) (この著者で検索)
ORCID ;
Ernst Bauer (author) (この著者で検索)
ORCID
キーワード
boride
刊行年月日
2024-08-27
更新時刻
2024-10-09 08:31:06 +0900
R_Toyama_et_al_FeCoIr_ANE_20231224_Cleaned.pdf
Extrinsic contribution to the anomalous Hall effect and Nernst effect in Fe 3 Co single-crystal thin films by Ir doping
ジャーナル論文
著者
Ryo Toyama (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Weinan Zhou (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Yuya Sakuraba (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
anomalous Hall effect, anomalous Nernst effect, Seebeck effect, spin-orbit coupling
刊行年月日
2024-02-12
更新時刻
2024-08-31 08:31:07 +0900
HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
HfO2-Fig6-Work-20230118.pdf
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
HfO2-Fig7-Work-20221213.pdf
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900
HfO2-Fig8-Work-20220304-2.pdf
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:11:29 +0900