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論文・データセット
コレクション
PoLyInfo Knowledge Collection(2)
The history of DICE and NIMS Digital Library(1)
資源タイプ
データセット(23)
キーワード
Auger depth profiling analysis (8)
HfO2/Si (8)
Ultra low angle incidence ion beam (8)
Ferromagnetic resonance (2)
Half-metals (2)
Heusler alloy (2)
Magnetic thin films (2)
Magnetization dynamics (2)
PoLyInfo (2)
Polymer chemistry knowledge (2)
(more)
ライセンス
Creative Commons BY Attribution 4.0 International (9)
In Copyright (9)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
ファイル種別
application/pdf (13)
application/zip (11)
text/csv (4)
application/octet-stream (2)
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet (2)
application/xml (2)
application/json (1)
application/rdf+xml (1)
application/vnd.openxmlformats-officedocument.wordprocessingml.document (1)
計算手法
https://matvoc.nims.go.jp/entity/Q21 (1)
試料種別
金属・合金 (1)
装置名
B-H tracer (1)
Carl Zeiss Crossbeam 1540 EsB FIB/SEM (1)
資源タイプ: データセット
全ての絞り込みを解除
23 件のレコードが見つかりました。 11件目から20件目まで表示します。
全ての絞り込みを解除
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:11:29 +0900
Supplemental data to 'A unified model for metallic materials reliability data and its application in NIMS Metallic Materials Database (Kinzoku)'
データセット
著者
Asahiko Matsuda
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5989-027X
National Institute for Materials Science Research Network and Facility Services Division
NIMS Researchers Directory SAMURAI
Asahiko Matsuda
;
Masahiko Demura
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7308-3041
National Institute for Materials Science Research Network and Facility Services Division
NIMS Researchers Directory SAMURAI
Masahiko Demura
;
Masayoshi Yamazaki
(author) (
この著者で検索
)
National Institute for Materials Science
Masayoshi Yamazaki
;
Takuya Kadohira
(author) (
この著者で検索
)
https://orcid.org/0000-0003-0569-1309
National Institute for Materials Science Research Network and Facility Services Division
NIMS Researchers Directory SAMURAI
Takuya Kadohira
;
Toshihiro Ashino
(author) (
この著者で検索
)
https://orcid.org/0009-0002-9592-8516
(unauthenticated)
Toyo University Faculty of Regional Development Studies
Toshihiro Ashino
;
Yoshiyuki Furuya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-3039-5280
National Institute for Materials Science Research Center for Structural Materials
NIMS Researchers Directory SAMURAI
Yoshiyuki Furuya
;
Kota Sawada
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7780-1648
National Institute for Materials Science Research Center for Structural Materials
NIMS Researchers Directory SAMURAI
Kota Sawada
;
Nobutaka Nishikawa
(author) (
この著者で検索
)
Mizuho Research & Technologies, Ltd.
Nobutaka Nishikawa
キーワード
metallic materials
,
structural materials
,
database
,
data format
,
data model
,
creep
,
fatigue
刊行年月日
2025-12-31
更新時刻
2025-08-01 08:55:21 +0900
PoLyInfo Conceptual Schema Version 1.0
データセット
コレクション
PoLyInfo Knowledge Collection
著者
Masashi Ishii
(author) (
この著者で検索
)
https://orcid.org/0000-0003-0357-2832
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Masashi Ishii
;
Koichi Sakamoto
(author) (
この著者で検索
)
National Institute for Materials Science
Koichi Sakamoto
キーワード
Polymer chemistry knowledge
,
PoLyInfo
,
Conceptual schema
,
ShEx
,
collection - PoLyInfo Knowledge
刊行年月日
更新時刻
2024-03-27 12:30:25 +0900
Local- and Intermediate-Range Atomic Structures of (Ga
2
S
3
)
0.25
(GeS
2
)
0.75
Glass: Complementary Use of X-Rays and Neutrons
データセット
著者
Shinya Hosokawa
(author) (
この著者で検索
)
Shinya Hosokawa
;
Yohei Onodera
(author) (
この著者で検索
)
Yohei Onodera
;
László Pusztai
(author) (
この著者で検索
)
László Pusztai
;
Jens Rüdiger Stellhorn
(author) (
この著者で検索
)
Jens Rüdiger Stellhorn
;
Hiroo Tajiri
(author) (
この著者で検索
)
Hiroo Tajiri
;
Kazutaka Ikeda
(author) (
この著者で検索
)
Kazutaka Ikeda
;
Toshiya Otomo
(author) (
この著者で検索
)
Toshiya Otomo
キーワード
Neutron diffraction
,
Anomalous X-ray scattering
,
Reverse Monte Carlo modeling
,
Glass structure
刊行年月日
2026-06-12
更新時刻
2026-06-17 10:24:46 +0900
キーワード
Auger depth profiling analysis
(8)
HfO2/Si
(8)
Ultra low angle incidence ion beam
(8)
Ferromagnetic resonance
(2)
Half-metals
(2)
Heusler alloy
(2)
Magnetic thin films
(2)
Magnetization dynamics
(2)
PoLyInfo
(2)
Polymer chemistry knowledge
(2)
Spin current
(2)
Spin pumping
(2)
collection - PoLyInfo Knowledge
(2)
data model
(2)
database
(2)
Active learning
(1)
Anomalous X-ray scattering
(1)
BFO
(1)
Bayesian Optimization
(1)
Coercivity
(1)
Conceptual schema
(1)
Data management
(1)
Debye model
(1)
Diamond
(1)
First-principles calculation
(1)
Glass structure
(1)
Hot extrusion
(1)
Machine learning
(1)
Materials informatics
(1)
Maximum energy product
(1)
Metadata
(1)
Nd-Fe-B magnet
(1)
Neutron diffraction
(1)
Ontology
(1)
Process
(1)
RDE
(1)
Remanence
(1)
Research Data Express
(1)
Reverse Monte Carlo modeling
(1)
ShEx
(1)
Sommerfeld model
(1)
Squareness
(1)
System architecture
(1)
compound semiconductor
(1)
creep
(1)
data management
(1)
data format
(1)
data structure
(1)
dataset
(1)
energy loss function
(1)
fatigue
(1)
first-principles calculation
(1)
information extraction
(1)
machine learning
(1)
magnetic property
(1)
materials informatics
(1)
materials science
(1)
metallic materials
(1)
natural language processing
(1)
ontology
(1)
optical constant
(1)
photodetector
(1)
process chain
(1)
quasi-harmonic vibrational contribution
(1)
solid electrolytes
(1)
structural materials
(1)
superconductors
(1)
tdm
(1)
titanium alloys
(1)
RDEメタデータ定義
RDE送り状
<
1
2
3
>
絞り込み
コレクション
PoLyInfo Knowledge Collection(2)
The history of DICE and NIMS Digital Library(1)
資源タイプ
データセット(23)
キーワード
Auger depth profiling analysis (8)
HfO2/Si (8)
Ultra low angle incidence ion beam (8)
Ferromagnetic resonance (2)
Half-metals (2)
Heusler alloy (2)
Magnetic thin films (2)
Magnetization dynamics (2)
PoLyInfo (2)
Polymer chemistry knowledge (2)
(more)
ライセンス
Creative Commons BY Attribution 4.0 International (9)
In Copyright (9)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
ファイル種別
application/pdf (13)
application/zip (11)
text/csv (4)
application/octet-stream (2)
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet (2)
application/xml (2)
application/json (1)
application/rdf+xml (1)
application/vnd.openxmlformats-officedocument.wordprocessingml.document (1)
計算手法
https://matvoc.nims.go.jp/entity/Q21 (1)
試料種別
金属・合金 (1)
装置名
B-H tracer (1)
Carl Zeiss Crossbeam 1540 EsB FIB/SEM (1)