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1715 件のレコードが見つかりました。 1501件目から1510件目まで表示します。
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:11:29 +0900
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
- ジャーナル論文
- 著者
-
Yoshikawa, Hideki (author) (この著者で検索)
;
Ogiwara, Toshiya (author) (この著者で検索)
;
Nagata, Takahiro (author) (この著者で検索)
- キーワード
- Auger Depth Profiling analysis, HfO2/Si, Ultra Low Angle Incidence Ion Beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:11:28 +0900
Fermi surface and light quasi particles in hourglass nodal chain metal β-ReO2
- ジャーナル論文
- 著者
-
Daigorou Hirai (author) (この著者で検索)
https://orcid.org/0000-0003-2883-4376
(unauthenticated)
Nagoya University Department of Applied Physics
;
;Takahito Anbai (author) (この著者で検索)University of Tokyo Institute for Solid State Physics,Takako Konoike (author) (この著者で検索)NIMS Research Center for Materials Nanoarchitectonics (MANA)
;
Shinya Uji (author) (この著者で検索)NIMS Research Center for Materials Nanoarchitectonics (MANA)
;
Yuya Hattori (author) (この著者で検索)NIMS Research Center for Materials Nanoarchitectonics (MANA)
;
Taichi Terashima (author) (この著者で検索)NIMS Research Center for Materials Nanoarchitectonics (MANA)
;
Hajime Ishikawa (author) (この著者で検索)
https://orcid.org/0000-0002-1303-9460
(unauthenticated)
University of Tokyo Institute for Solid State Physics
;
;Koichi Kindo (author) (この著者で検索)University of Tokyo Institute for Solid State PhysicsNaoyuki Katayama (author) (この著者で検索)
https://orcid.org/0000-0002-9456-2201
(unauthenticated)
Nagoya University, Department of Applied Physics
;
Tamio Oguchi (author) (この著者で検索)
https://orcid.org/0000-0001-7109-2801
(unauthenticated)
Osaka University Graduate School of Engineering Science
;
Zenji Hiroi (author) (この著者で検索)
https://orcid.org/0000-0003-1190-2344
(unauthenticated)
University of Tokyo Institute for Solid State Physics
- キーワード
- Fermi surface, nodal chain metal, ReO2
- 刊行年月日
- 2023-10-09
- 更新時刻
- 2024-10-21 12:30:40 +0900
High-throughput evaluation of half-metallicity of Co 2 MnSi Heusler alloys using composition-spread films and spin-integrated hard X-ray photoelectron spectroscopy
- ジャーナル論文
- 著者
-
Ryo Toyama (author) (この著者で検索)National Institute for Materials Science
;
Shunsuke Tsuda (author) (この著者で検索)National Institute for Materials Science
;
Yuma Iwasaki (author) (この著者で検索)National Institute for Materials Science
;
Thang Dinh Phan (author) (この著者で検索)National Institute for Materials Science
;
;Susumu Yamamoto (author) (この著者で検索);Hiroyuki Yamane (author) (この著者で検索)Koichiro Yaji (author) (この著者で検索)National Institute for Materials Science
;
Yuya Sakuraba (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Heusler alloys, half metallicity, Co2MnSi, composition-spread films, hard X-ray photoelectron spectroscopy, density of states, anisotropic magnetoresistance effect, NanoTerasu
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-12-24 17:27:29 +0900