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7089 件のレコードが見つかりました。
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:11:29 +0900
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
- ジャーナル論文
- 著者
-
Yoshikawa, Hideki (author) (この著者で検索)
;
Ogiwara, Toshiya (author) (この著者で検索)
;
Nagata, Takahiro (author) (この著者で検索)
- キーワード
- Auger Depth Profiling analysis, HfO2/Si, Ultra Low Angle Incidence Ion Beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:11:28 +0900
Locally Doped Transferred Contacts for WSe2 Transistors
- ジャーナル論文
- 著者
-
He-Yu Chen (author) (この著者で検索)
https://orcid.org/0009-0004-7101-9179
(unauthenticated)
;
Jheng-Jie Lin (author) (この著者で検索)
https://orcid.org/0009-0002-1263-9453
(unauthenticated)
;
;Sheng-Shong Wong (author) (この著者で検索);Zhen-You Lin (author) (この著者で検索)Yu-Chiang Hsieh (author) (この著者で検索)
https://orcid.org/0009-0001-3346-9548
(unauthenticated)
;
;Kuo-En Chang (author) (この著者で検索);Chung-Lin Wu (author) (この著者で検索)Kenji Watanabe (author) (この著者で検索)
;
Takashi Taniguchi (author) (この著者で検索)
;
;Tse-Ming Chen (author) (この著者で検索)Luke W. Smith (author) (この著者で検索)
https://orcid.org/0000-0003-2194-4708
(unauthenticated)
- キーワード
- 2D field-effect transistors, contact resistance, WSe2
- 刊行年月日
- 2024-11-26
- 更新時刻
- 2025-02-05 16:30:33 +0900
Evolution of microstructure and defects in sintering of tape-cast alumina laminates observed by synchrotron X-ray multiscale tomography
- ジャーナル論文
- 著者
-
Gaku Okuma (author) (この著者で検索)National Institute for Materials Science
;
;Ryutaro Usukawa (author) (この著者で検索)Toshio Osada (author) (この著者で検索)National Institute for Materials Science
;
;Naoki Kondo (author) (この著者で検索);Hideaki Nakajima (author) (この著者で検索);Toshiya Okazaki (author) (この著者で検索);Shingo Machida (author) (この著者で検索);Yutaro Arai (author) (この著者で検索);Ryo Inoue (author) (この著者で検索)Hideki Kakisawa (author) (この著者で検索)National Institute for Materials Science
;
Kazuya Shimoda (author) (この著者で検索)National Institute for Materials Science
;
;Akihisa Takeuchi (author) (この著者で検索);Masayuki Uesugi (author) (この著者で検索)Fumihiro Wakai (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Ceramic tape casting, Synchrotron X-ray tomography, 3D microstructure, Sintering
- 刊行年月日
- 2024-04-10
- 更新時刻
- 2024-08-22 14:43:41 +0900
Enhancing Thermoelectric Performance: The Impact of Carbon Incorporation in Spin-Coated Al-Doped ZnO Thin Films
- ジャーナル論文
- 著者
-
;Alberto Giribaldi (author) (この著者で検索);Cristiano Giordani (author) (この著者で検索);Giovanna Latronico (author) (この著者で検索)Cédric Bourgès (author) (この著者で検索)National Institute for Materials Science
;
;Takahiro Baba (author) (この著者で検索);Cecilia Piscino (author) (この著者で検索);Maya Marinova (author) (この著者で検索)Takao Mori (author) (この著者で検索)National Institute for Materials Science
;
;Cristina Artini (author) (この著者で検索);Hannes Rijckaert (author) (この著者で検索)Paolo Mele (author) (この著者で検索)
- キーワード
- thermoelectric
- 刊行年月日
- 2025-01-19
- 更新時刻
- 2025-11-11 08:30:17 +0900