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1126 件のレコードが見つかりました。 1111件目から1120件目まで表示します。
Potential-Switchable Viscoelasticity of Protein Nanolayers at a Liquid/Liquid Interface
- ジャーナル論文
- 著者
-
;Kosuke Ishii (author) (この著者で検索)Takeshi Ueki (author) (この著者で検索)
;
Jun Nakanishi (author) (この著者で検索)
;
Kazuhiro Akutsu-Suyama (author) (この著者で検索)
https://orcid.org/0000-0002-4797-6604
(unauthenticated)
;
Norifumi L. Yamada (author) (この著者で検索)
https://orcid.org/0000-0002-8370-4526
(unauthenticated)
;
Yuko Yokoyama (author) (この著者で検索)
https://orcid.org/0000-0002-3943-0978
(unauthenticated)
;
Tetsuo Sakka (author) (この著者で検索)
https://orcid.org/0000-0002-1892-8056
(unauthenticated)
;
Naoya Nishi (author) (この著者で検索)
https://orcid.org/0000-0002-5654-5603
(unauthenticated)
- キーワード
- ionic liquid, interface, electrochemistry, viscoelasticity, cell, mechanobiology
- 刊行年月日
- 2025-07-15
- 更新時刻
- 2025-09-02 16:30:27 +0900
Atomic cation vacancy engineering of NiFe-LDH nanosheets towards oxygen evolution reaction
- 会議発表ポスター
- 著者
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Huanran Li (author) (この著者で検索)National Institute for Materials Science Research Center for Materials Nanoarchitectonics (MANA)/Nanomaterials Field/Functional Nanomaterials Group
;
;Yoshiyuki Sugahara (author) (この著者で検索)Waseda UniveristyTakayoshi Sasaki (author) (この著者で検索)National Institute for Materials Science Research Center for Materials Nanoarchitectonics (MANA)/Nanomaterials Field/Soft Chemistry Group
;
Renzhi Ma (author) (この著者で検索)National Institute for Materials Science Research Center for Materials Nanoarchitectonics (MANA)/Nanomaterials Field/Functional Nanomaterials Group
- キーワード
- vacancy
- 刊行年月日
- 更新時刻
- 2024-10-23 12:30:19 +0900
Ferrimagnetic structures with rare-earth induced spin-reorientation in the Mn self-doped perovskite (Er0.7Mn0.3)MnO3
- ジャーナル論文
- 著者
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Andreas Dönni (author) (この著者で検索)National Institute for Materials Science
;
;Vladimir Y. Pomjakushin (author) (この著者で検索);Martin Rotter (author) (この著者で検索)Lei Zhang (author) (この著者で検索)
https://orcid.org/0000-0003-1173-4328
(unauthenticated)
National Institute for Materials Science
;
Kazunari Yamaura (author) (この著者で検索)National Institute for Materials Science
;
Alexei A. Belik (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Perovskites, Crystal structure, magnetic structure, spin-reorientation, ferrimagnets
- 刊行年月日
- 2024-08-12
- 更新時刻
- 2024-10-02 10:15:50 +0900
Hydrogen-Embrittled Fracture of Dual Phase High-Strength Steel Sheets with Different Microstructural Hardness
- プロシーディングス論文
- 著者
-
KEI SAITO (author) (この著者で検索)
https://orcid.org/0000-0001-8369-4797
(unauthenticated)
National Institute for Materials Science Center for Basic Research on Materials/Data-driven Materials Research Field/Materials Modeling Group
;
MASAHIKO DEMURA (author) (この著者で検索)National Institute for Materials Science Center for Basic Research on Materials/Data-driven Materials Research Field/Materials Modeling Group
;
KENICHI TAKAI (author) (この著者で検索)Sophia University
- キーワード
- hydrogen embrittlement, dual phase steel, hardness, ductility
- 刊行年月日
- 更新時刻
- 2026-01-07 11:05:00 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900