Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation

論文

著者

Tanuma, Shigeo ; Powell, C. J. ; Penn, D. R.

キーワード

IMFP, TPP-2M, number of valence electrons, elemental solids, XPS, electron inelastic mean free paths, surface sensitivity, IMFPs, AES, surface analysis

刊行年月日

2003-02-11

更新時刻

2022-10-03 01:54:38 +0900