2 件のレコードが見つかりました。
Defect engineering-induced Seebeck coefficient and carrier concentration decoupling in CuI by noble gas ion implantation
- ジャーナル論文
- 著者
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Martin Markwitz (author) (この著者で検索)
https://orcid.org/0009-0007-6516-3571
(unauthenticated)
;
Peter P. Murmu (author) (この著者で検索)
https://orcid.org/0000-0002-0109-1798
(unauthenticated)
;
Takao Mori (author) (この著者で検索)
;
John V. Kennedy (author) (この著者で検索)
https://orcid.org/0000-0002-9126-4997
(unauthenticated)
;
Ben J. Ruck (author) (この著者で検索)
https://orcid.org/0000-0002-3719-7375
(unauthenticated)
- キーワード
- thermoelectric
- 刊行年月日
- 2024-11-18
- 更新時刻
- 2024-11-25 16:30:11 +0900
Defect and dopant complex mediated high power factor in transparent selenium-doped copper iodide thin films
- ジャーナル論文
- 著者
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;Peter P. Murmu (author) (この著者で検索);Martin Markwitz (author) (この著者で検索);Shen V. Chong (author) (この著者で検索);Niall Malone (author) (この著者で検索)Takao Mori (author) (この著者で検索)National Institute for Materials Science
;
;Himanshu Vyas (author) (この著者で検索);L. John Kennedy (author) (この著者で検索);Sergey Rubanov (author) (この著者で検索);Clastinrusselraj Indirathankam Sathish (author) (この著者で検索);Jiabao Yi (author) (この著者で検索)John V. Kennedy (author) (この著者で検索)
https://orcid.org/0000-0002-9126-4997
(unauthenticated)
- キーワード
- thermoelectric
- 刊行年月日
- 2024-06-29
- 更新時刻
- 2024-10-08 12:30:41 +0900