Local defect and mid-gap state analysis of GaN using monochromated EELS combined with nanodiffraction and atomic-resolution imaging
- ジャーナル論文
- 著者
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Shunsuke Yamashita (author) (この著者で検索)
https://orcid.org/0000-0003-1702-1708
(unauthenticated)
;
;Sei Fukushima (author) (この著者で検索)Jun Kikkawa (author) (この著者で検索)National Institute for Materials Science (NIMS) Center for Basic Research on Materials
;
;Ryoji Arai (author) (この著者で検索)Yuya Kanitani (author) (この著者で検索)
https://orcid.org/0009-0002-2154-5571
(unauthenticated)
;
Koji Kimoto (author) (この著者で検索)National Institute for Materials Science (NIMS) Center for Basic Research on Materials
;
Yoshihiro Kudo (author) (この著者で検索) - キーワード
- defect, GaN, EELS, 4D-STEM, HAADF-STEM, ABF-STEM, HAXPES
- 刊行年月日
- 2024-03-01
- 更新時刻
- 2024-03-19 16:56:29 +0900
Chemical Interface Structures in CdS/RbInSe2/Cu(In,Ga)Se2 Thin‐Film Solar Cell Stacks
- ジャーナル論文
- 著者
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Jakob Bombsch (author) (この著者で検索)
https://orcid.org/0000-0002-0820-162X
(unauthenticated)
;
Tim Kodalle (author) (この著者で検索)
https://orcid.org/0000-0002-8792-9669
(unauthenticated)
;
Raul Garcia‐Diez (author) (この著者で検索)
https://orcid.org/0009-0000-9374-1083
(unauthenticated)
;
;Claudia Hartmann (author) (この著者で検索);Roberto Félix (author) (この著者で検索)Shigenori Ueda (author) (この著者で検索)
;
Regan G. Wilks (author) (この著者で検索)
https://orcid.org/0000-0001-5822-8399
(unauthenticated)
;
Christian A. Kaufmann (author) (この著者で検索)
https://orcid.org/0000-0001-9168-2032
(unauthenticated)
;
Marcus Bär (author) (この著者で検索)
https://orcid.org/0000-0001-8581-0691
(unauthenticated)
- キーワード
- Thin-film solar cell stack, interface, Chemical analysis, hard X-ray photoemission spectroscopy, HAXPES
- 刊行年月日
- 2024-05-06
- 更新時刻
- 2024-08-01 16:30:13 +0900