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MDR phonon calculation database(5005)
MDR lattice thermal conductivity calculation database(4811)
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Lattice thermal conductivity calculation datasets for 103 binary compounds by finite displacement method (PBE)(70)
Lattice thermal conductivity calculation datasets for 103 binary compounds by finite displacement method(70)
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READS: Database of Promising Adsorbents for Decontamination of Radioactive Substances(4)
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Phonon (5145)
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collection - MDR XAFS DB (2026)
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https://matvoc.nims.go.jp/entity/Q21 (1)
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Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:11:29 +0900
Evaluation of spin mixing conductance in Co2FeGa0.5Ge0.5/Pt bilayer and the effect of ultrathin Cu, Ni, Ru, Ta, or Cr insertion layers
データセット
著者
Madhav Mohan Bhat
(author) (
この著者で検索
)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
Madhav Mohan Bhat
;
Hirofumi Suto
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4387-5862
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
NIMS Researchers Directory SAMURAI
Hirofumi Suto
;
Taisuke T. Sasaki
(author) (
この著者で検索
)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
Taisuke T. Sasaki
;
Alagarsamy Perumal
(author) (
この著者で検索
)
Indian Institute of Technology (IIT) Guwahati
Alagarsamy Perumal
;
Ananthakrishnan Srinivasan
(author) (
この著者で検索
)
Indian Institute of Technology (IIT) Guwahati
Ananthakrishnan Srinivasan
;
Yuya Sakuraba
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4618-9550
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
NIMS Researchers Directory SAMURAI
Yuya Sakuraba
キーワード
Spin pumping
,
Magnetization dynamics
,
Spin current
,
Ferromagnetic resonance
,
Half-metals
,
Heusler alloy
,
Magnetic thin films
刊行年月日
更新時刻
2026-07-14 15:41:13 +0900
Supplemental data to 'A unified model for metallic materials reliability data and its application in NIMS Metallic Materials Database (Kinzoku)'
データセット
著者
Asahiko Matsuda
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5989-027X
National Institute for Materials Science Research Network and Facility Services Division
NIMS Researchers Directory SAMURAI
Asahiko Matsuda
;
Masahiko Demura
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7308-3041
National Institute for Materials Science Research Network and Facility Services Division
NIMS Researchers Directory SAMURAI
Masahiko Demura
;
Masayoshi Yamazaki
(author) (
この著者で検索
)
National Institute for Materials Science
Masayoshi Yamazaki
;
Takuya Kadohira
(author) (
この著者で検索
)
https://orcid.org/0000-0003-0569-1309
National Institute for Materials Science Research Network and Facility Services Division
NIMS Researchers Directory SAMURAI
Takuya Kadohira
;
Toshihiro Ashino
(author) (
この著者で検索
)
https://orcid.org/0009-0002-9592-8516
(unauthenticated)
Toyo University Faculty of Regional Development Studies
Toshihiro Ashino
;
Yoshiyuki Furuya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-3039-5280
National Institute for Materials Science Research Center for Structural Materials
NIMS Researchers Directory SAMURAI
Yoshiyuki Furuya
;
Kota Sawada
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7780-1648
National Institute for Materials Science Research Center for Structural Materials
NIMS Researchers Directory SAMURAI
Kota Sawada
;
Nobutaka Nishikawa
(author) (
この著者で検索
)
Mizuho Research & Technologies, Ltd.
Nobutaka Nishikawa
キーワード
metallic materials
,
structural materials
,
database
,
data format
,
data model
,
creep
,
fatigue
刊行年月日
2025-12-31
更新時刻
2025-08-01 08:55:21 +0900
キーワード
Phonon
(5145)
Lattice thermal conductivity
(4811)
XAFS
(2026)
collection - MDR XAFS DB
(2026)
SPring-8
(1717)
BL14B2
(1678)
Si(111)
(1180)
Si(311)
(785)
Pnma (62)
(513)
P2_1/c (14)
(411)
Oxide
(381)
R-3m (166)
(239)
C2/m (12)
(217)
Oxide_ate
(205)
Hokkaido University, Institute for Catalysis
(199)
Chloride
(182)
P-3m1 (164)
(182)
Alloy
(181)
Pure metal
(167)
P2_1/m (11)
(165)
P6_3/mmc (194)
(155)
P4/nmm (129)
(148)
Cmcm (63)
(147)
Fm-3m (225)
(131)
I4/mmm (139)
(124)
Ni K-edge
(103)
C2/c (15)
(100)
Transition metal alloy
(99)
Fe K-edge
(98)
Sulfide
(91)
P6_3mc (186)
(89)
Co K-edge
(86)
Pm-3m (221)
(83)
W L21-edge
(81)
I4_1/amd (141)
(79)
I-42d (122)
(77)
Fluoride
(75)
Metalloid alloy
(74)
R-3 (148)
(74)
Aichi SR
(72)
Cu K-edge
(71)
Sulfate
(71)
Nitrate
(68)
Ag K-edge
(67)
Bromide
(67)
Zn K-edge
(67)
P6_3 (173)
(66)
BL5S1
(64)
P3m1 (156)
(64)
Tungstate
(64)
functionally graded materials
(64)
P4/mmm (123)
(61)
F-43m (216)
(60)
Pb L21-edge
(60)
P2_1 (4)
(58)
P2_12_12_1 (19)
(58)
P4_2/mnm (136)
(58)
Mo K-edge
(57)
CdI2
(55)
In K-edge
(55)
Sn K-edge
(55)
Hydroxide
(53)
Ritsumeikan-SR
(53)
I-4 (82)
(52)
BL-10
(51)
Mn K-edge
(51)
Nb K-edge
(51)
Zr K-edge
(51)
P2/c (13)
(49)
P6_3/m (176)
(49)
Cmc2_1 (36)
(48)
Pmn2_1 (31)
(48)
Boride
(47)
Pd K-edge
(47)
W L3-edge
(47)
Ba L21-edge
(46)
I4/mcm (140)
(44)
R-3c (167)
(44)
Pna2_1 (33)
(43)
R3m (160)
(42)
Iodide
(41)
Silicide
(41)
Cr K-edge
(40)
La L21-edge
(40)
Nitride
(39)
Organometal
(39)
Carbide
(38)
Carbonate
(38)
BL46XU
(37)
HAXPES
(37)
P-42_1m (113)
(37)
P2_13 (198)
(37)
P4/mbm (127)
(37)
collection - MDR HAXPES DB
(37)
Ibam (72)
(36)
Pbcn (60)
(36)
Ta L21-edge
(36)
Ti K-edge
(36)
P321 (150)
(35)
Oxalate
(34)
Titanate
(34)
Molybdate
(33)
I4_1/a (88)
(32)
Pb L3-edge
(32)
Pmmn (59)
(32)
Sb K-edge
(31)
Acetate
(30)
Immm (71)
(30)
P3_121 (152)
(29)
Pc (7)
(29)
Pt L3-edge
(29)
Er L21-edge
(28)
Pnnm (58)
(28)
Ru K-edge
(28)
C2 (5)
(27)
Hydride
(27)
Ce L21-edge
(26)
P-31c (163)
(25)
P-62m (189)
(25)
Ba K-edge
(24)
Cs L21-edge
(24)
Pbam (55)
(24)
Ba L3-edge
(23)
P-31m (162)
(23)
Photon Factory
(23)
Rh K-edge
(23)
SiO2
(23)
ZnS
(23)
Au L3-edge
(22)
Phosphate
(22)
Cc (9)
(21)
P6_3cm (185)
(21)
Ta L3-edge
(21)
I4/m (87)
(20)
La K-edge
(20)
La L3-edge
(20)
Pbcm (57)
(20)
W K-edge
(20)
Yb L21-edge
(20)
Zirconate
(20)
P-3 (147)
(19)
Pt L2-edge
(19)
V K-edge
(19)
Acetylacetonate
(18)
Eu L21-edge
(18)
Au L1-edge
(17)
Au L2-edge
(17)
BL-9C
(17)
I-42m (121)
(17)
Imma (74)
(17)
P-43m (215)
(17)
Pbca (61)
(17)
Phosphorate
(17)
Pnna (52)
(17)
Pt L1-edge
(17)
ZrO2
(17)
Cm (8)
(16)
Ir L21-edge
(16)
Pmc2_1 (26)
(16)
Tb L21-edge
(16)
BiOF
(15)
In
(15)
Indium
(15)
P4_2/nmc (137)
(15)
Tungsten carbide
(15)
Ce K-edge
(14)
Ce L3-edge
(14)
Er L3-edge
(14)
Fd-3m (227)
(14)
P-6c2 (188)
(14)
PtO2
(14)
Tantalum boride
(14)
Tantalum nitride
(14)
Au
(13)
Chlorate
(13)
Cmce (64)
(13)
Cmmm (65)
(13)
P4_12_12 (92)
(13)
PbI2
(13)
Pd
(13)
Platinum
(13)
Pt
(13)
R3c (161)
(13)
Ama2 (40)
(12)
Cs K-edge
(12)
Cs L3-edge
(12)
Gold
(12)
Ir L3-edge
(12)
P-3c1 (165)
(12)
Palladium
(12)
WS2
(12)
(La,Sr)CoO3
(11)
AgI
(11)
AlHO2
(11)
BaTiO3
(11)
BaWO4
(11)
Barium tungstate
(11)
CuI
(11)
Er2S3
(11)
Metal acid
(11)
RDEメタデータ定義
RDE送り状
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