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ジャーナル論文(3)
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Bayesian estimation (3)
X-ray photoelectron spectroscopy (2)
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Exchange Monte Carlo method (1)
Feature selection (1)
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SESSA (1)
Silicon surface oxidation (1)
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キーワード: Bayesian estimation
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3 件のレコードが見つかりました。
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Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data
ジャーナル論文
著者
Atsushi Machida
(author) (
この著者で検索
)
Atsushi Machida
;
Kenji Nagata
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9894-4461
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
;
Ryo Murakami
(author) (
この著者で検索
)
https://orcid.org/0000-0001-8585-9268
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Ryo Murakami
;
Hiroshi Shinotsuka
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Hayaru Shouno
(author) (
この著者で検索
)
Hayaru Shouno
;
Hideki Yoshikawa
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Masato Okada
(author) (
この著者で検索
)
Masato Okada
キーワード
X-ray photoelectron spectroscopy
,
Bayesian estimation
,
Exchange Monte Carlo method
,
SESSA
刊行年月日
2024-05-29
更新時刻
2025-11-10 12:30:27 +0900
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
ジャーナル論文
著者
Hiroshi Shinotsuka
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Kenji Nagata
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9894-4461
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
;
Hideki Yoshikawa
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shuichi Ogawa
(author) (
この著者で検索
)
Shuichi Ogawa
;
Akitaka Yoshigoe
(author) (
この著者で検索
)
Akitaka Yoshigoe
キーワード
Bayesian estimation
,
X-ray photoelectron spectroscopy
,
Statistical analysis
,
Silicon surface oxidation
刊行年月日
2024-12-03
更新時刻
2025-01-21 12:30:34 +0900
Bayesian inference for peak feature extraction and prediction of material property in X-ray diffraction data
ジャーナル論文
著者
Ryo Murakami
(author) (
この著者で検索
)
https://orcid.org/0000-0001-8585-9268
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Ryo Murakami
;
Taisuke T. Sasaki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5952-7638
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Taisuke T. Sasaki
;
Hideki Yoshikawa
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Yoshitaka Matsushita
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4968-8905
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Yoshitaka Matsushita
;
Keitaro Sodeyama
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9228-0729
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Keitaro Sodeyama
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Hiroshi Shinotsuka
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Kenji Nagata
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9894-4461
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
キーワード
Materials informatics
,
Spectral decomposition
,
Bayesian estimation
,
Feature selection
,
AI-ready
刊行年月日
2024-12-31
更新時刻
2025-11-10 16:30:53 +0900
キーワード
Bayesian estimation
(3)
X-ray photoelectron spectroscopy
(2)
AI-ready
(1)
Exchange Monte Carlo method
(1)
Feature selection
(1)
Materials informatics
(1)
SESSA
(1)
Silicon surface oxidation
(1)
Spectral decomposition
(1)
Statistical analysis
(1)
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絞り込み
コレクション
資源タイプ
ジャーナル論文(3)
キーワード
Bayesian estimation (3)
X-ray photoelectron spectroscopy (2)
AI-ready (1)
Exchange Monte Carlo method (1)
Feature selection (1)
Materials informatics (1)
SESSA (1)
Silicon surface oxidation (1)
Spectral decomposition (1)
Statistical analysis (1)
(more)
ライセンス
Creative Commons BY Attribution 4.0 International (2)
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (1)
ファイル種別
application/pdf (3)