Quantitative characterization of built-in potential profile across GaAs p–n junctions using Kelvin probe force microscopy with qPlus sensor AFM

Article

Creator

Nobuyuki Ishida ; Takaaki Mano

Keyword

GaAs(110), Kelvin probe force microscopy, p-n junction, qPlus sensor

Date published

2024-02-05

Updated at

2024-04-04 08:30:11 +0900