Quantitative characterization of built-in potential profile across GaAs p–n junctions using Kelvin probe force microscopy with qPlus sensor AFM

Journal article

Creator

Nobuyuki Ishida (author) (Search by this author)

https://orcid.org/0000-0003-0161-0583

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Nobuyuki Ishida ;

Takaaki Mano (author) (Search by this author)

https://orcid.org/0000-0002-6955-260X

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Takaaki Mano

Keyword

GaAs(110), Kelvin probe force microscopy, p-n junction, qPlus sensor

Date published

2024-02-05

Updated at

2024-04-04 08:30:11 +0900