Overestimation of Operational Stability in Polymer-Based Organic Field-Effect Transistors Caused by Contact Resistance

Article

Creator

Kenji Sakamoto ; Takeshi Yasuda ; Takeo Minari ; Masafumi Yoshio ; Junpei Kuwabara ; Masayuki Takeuchi

Keyword

polymer-based organic field-effect transistors, bias-stress effects, contact resistance, modified transmission line method, operational stability

Date published

2024-12-11

Updated at

2025-12-04 16:39:15 +0900