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mean escape depth (2)
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asymmetry parameter (1)
effective attenuation length (1)
high-energy photoelectron spectroscopy (1)
inelastic mean free path (1)
information depth (1)
lnearly polarized X-rays (1)
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Keyword: mean escape depth
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電子分光法における表面感度と検出深さ
Article
Creator
田沼 繁夫
Keyword
surface sensitivity
,
mean escape depth
,
effective attenuation length
,
information depth
,
inelastic mean free path
Date published
2022-03-10
Updated at
2024-01-05 22:12:47 +0900
Calculations of Mean Escape Depths of Photoelectrons in Elemental Solids Excited by Linearly Polarized X-rays for High-Energy Photoelectron Spectroscopy
Article
Creator
Yoshikawa, Hideki
;
Shinotsuka, Hiroshi
;
Tanuma, Shigeo
; Ueda, Ryuichi
Keyword
MED
,
high-energy photoelectron spectroscopy
,
asymmetry parameter
,
lnearly polarized X-rays
,
mean escape depth
Date published
2013-09-12
Updated at
2024-01-05 22:12:03 +0900
Keyword
mean escape depth
(2)
MED
(1)
asymmetry parameter
(1)
effective attenuation length
(1)
high-energy photoelectron spectroscopy
(1)
inelastic mean free path
(1)
information depth
(1)
lnearly polarized X-rays
(1)
surface sensitivity
(1)
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