Stable and high current emission of electrons from a HfC nanoneedle field-emitter fabricated by focused ion beam

Article

Creator

Shuai Tang ; Jie Tang ; Yimeng Wu ; You-Hu Chen ; Jun Uzuhashi ; Tadakatsu Ohkubo ; Masaki Takeguchi ; Lu-Chang Qin

Keyword

electron emission, transmission electron microscopy, focused ion beam

Date published

2025-03-06

Updated at

2025-04-12 08:30:10 +0900