An extraordinarily low-energy threshold of less than 60 keV for ion track formation in silicon

Journal article

Creator

H. Amekura (author) (Search by this author)

https://orcid.org/0000-0003-2148-8431

エネルギー・環境材料研究センター, NIMS

NIMS Researchers Directory SAMURAI

H. Amekura ;

K. Narumi (author) (Search by this author)

QST

K. Narumi ;

A. Chiba (author) (Search by this author)

QST

A. Chiba ;

Y. Hirano (author) (Search by this author)

QST

Y. Hirano ;

K. Yamada (author) (Search by this author)

QST

K. Yamada ;

S. Yamamoto (author) (Search by this author)

QST

S. Yamamoto ;

Y. Saitoh (author) (Search by this author)

QST

Y. Saitoh

Keyword

ion track, C60 ion, silicon, cluster effect, swift heavy ion

Date published

2024-12-09

Updated at

2025-01-21 12:30:27 +0900