An extraordinarily low-energy threshold of less than 60 keV for ion track formation in silicon

Article

Creator

H. Amekura ; K. Narumi ; A. Chiba ; Y. Hirano ; K. Yamada ; S. Yamamoto ; Y. Saitoh

Keyword

ion track, C60 ion, silicon, cluster effect, swift heavy ion

Date published

2024-12-09

Updated at

2025-01-21 12:30:27 +0900